1. P. Galář, J. Stuchlík, M. Müller, J. Kočka, K. Kůsová
    Highly spherical SiC nanoparticles grown in nonthermal plasma
    Plasma Processes and Polymers tba (2022) e2100127(1)-e2100127(10).
  2. M. Müller, P. Galář, J. Stuchlík, J. Kočka, Jonáš Kupka, K. Kůsová
    Synthesis and surface modification of light emitting silicon nanoparticles using non-thermal plasma techniques
    European Physical Journal - Applied Physics 89 (2020) 20401(1)-20401(6).
  3. M. Hývl, M. Müller, T. h. Stuchlíková, J. Stuchlík, M. Šilhavík, J. Kočka, A. Fejfar, J. Červenka
    Nucleation and growth of metal-catalyzed silicon nanowires under plasma
    Nanotechnology 31 (2020) 225601(1)-225601(11).
  4. M. Šilhavík, M. Müller, J. Stuchlík, T. h. Stuchlíková, M. Klementová, J. Kočka, A. Fejfar, J. Červenka
    Comparative study of catalyst-induced doping and metal incorporation in silicon nanowires
    Applied Physics Letters 114 (2019) 132103(1)-132103(5).
  5. M. Müller, M. Ledinský, J. Kočka, A. Fejfar, J. Červenka
    Effects of nanowire size and geometry on silicon nanowire array thin film solar cells
    Journal of Vacuum Science and Technology B 36 (2018) 011401(1)-011401(6).
  6. M. Müller, J. Kočka, A. Fejfar, J. Červenka
    Silicon Nanowire Array for Thin Film Solar Cells
    Aceees 2016
  7. J. Kočka, M. Müller, J. Stuchlík, T. h. Stuchlíková, J. Červenka, A. Fejfar
    Role of a-Si:H in lateral growth of crystalline silicon nanowires using Pb and In catalysts
    physica status solidi (a) 1-5 (2016) (1)-(5).
  8. M. Müller, M. Hývl, M. Kratzer, C. Teichert, S. Misra, M. Foldyna, L. Yu, P. Roca i Cabarrocas, T. Itoh, Z. Hájková, A. Vetuško, M. Ledinský, J. Kočka, A. Fejfar
    Investigating inhomogeneous electronic properties of radial junction solar cells using correlative microscopy
    Japanese Journal of Applied Physics 54 (2015) 08KA08-1-08KA08-5.
  9. A. Fejfar, M. Hývl, A. Vetuško, P. Pikna, Z. Hájková, M. Ledinský, J. Kočka, P. Klapetek, A. Marek, A. Mašková, J. Vyskočil, J. Merkel, C. Becker, T. Itoh, S. Misra, M. Foldyna, L. Yu, P. Roca i Cabarrocas
    Correlative microscopy of radial junction nanowire solar cells using nanoindent position markers
    Solar Energy Materials and Solar Cells 135 (2015) 106-112.
  10. M. Müller, J. Kočka, H. G. El Gohary, J. Stuchlík, T. h. Stuchlíková, K. Hruška, B. Rezek, M. Ledinský, A. Fejfar
    Preparation and testing of silicon nanowires
    Canadian Journal of Physics 7/8 (2014) 819-821.
  11. B. Stegemann, J. Čermák, B. Rezek, J. Kočka, M. Schmidt
    Silicon Nanodot Layers for Photovoltaic Application: Size/Density Control and Electrical Properties
    Zeitschrift für Physikalische Chemie 228 (2014) 543-556.
  12. Š. Potocký, J. Holovský, Z. Remeš, M. Müller, J. Kočka, A. Kromka
    Si-related color centers in nanocrystalline diamond thin films
    physica status solidi (b) 251 (2014) 2603-2606.
  13. A. Fejfar, M. Hývl, M. Ledinský, A. Vetuško, J. Stuchlík, J. Kočka, S. Misra, B. O'Donnell, M. Foldyna, Linwei Yu, P. Roca i Cabarrocas
    Microscopic measurements of variations in local (photo)electronic properties in nanostructured solar cells
    Solar Energy Materials and Solar Cells 119 (2013) 228-234.
  14. J. Kočka
    Relation of defects and grain boundaries to transport and photo-transport: Solved and unsolved problems in microcrystalline silicon
    Journal of Non-Crystalline Solids 358 (2012) 1946-1953.
  15. E. Verveniotis, E. Šípek, J. Stuchlík, J. Kočka, B. Rezek
    Generating ordered Si nanocrystals via atomic force microscopy
    Journal of Non-Crystalline Solids 358 (2012) 2118-2121.
  16. M. Ledinský, A. Fejfar, A. Vetuško, J. Stuchlík, J. Kočka
    Local photoconductivity of microcrystalline silicon thin films excited by 442 nm HeCd laser measured by conductive atomic force microscopy
    Journal of Non-Crystalline Solids 358 (2012) 2082-2085.
  17. A. Vetuško, T. Itoh, Y. Nakanishi, A. Fejfar, S. Nonomura, M. Ledinský, J. Kočka
    Conductive atomic force microscopy on carbon nanowalls
    Journal of Non-Crystalline Solids 358 (2012) 2545-2547.
  18. T. Itoh, Y. Nakanishi, T. Ito, A. Vetuško, M. Ledinský, A. Fejfar, J. Kočka, S. Nonomura
    Electrical properties of carbon nanowall films
    Journal of Non-Crystalline Solids 358 (2012) 2548-2551.
  19. B. Rezek, J. Čermák, A. Kromka, M. Ledinský, P. Hubík, J. J. Mareš, A. Purkrt, V. Cimrová, A. Fejfar, J. Kočka
    Synthesis, structure, and opto-electronic properties of organic-based nanoscale heterojunctions
    Nanoscale Research Letters 6 (2011) 238(1)-238(12).
  20. M. Ledinský, A. Fejfar, A. Vetuško, J. Stuchlík, B. Rezek, J. Kočka
    Local photoconductivity of microcrystalline silicon thin films measured by conductive atomic force microscopy
    Physica Status Solidi-Rapid Research Letters 5 (2011) 373-375.
  21. E. Verveniotis, B. Rezek, E. Šípek, J. Stuchlík, M. Ledinský, J. Kočka
    Impact of AFM-induced nano-pits in a-Si:H films on silicon crystal growth
    Nanoscale Research Letters 6 (2011) 145(1)-145(6).
  22. E. Verveniotis, B. Rezek, E. Šípek, J. Stuchlík, J. Kočka
    Role of current profiles and atomic force microscope tips on local lectric crystallization of amorphous silicon
    Thin Solid Films 518 (2010) 5965-5970.
  23. J. Červenka, M. Ledinský, J. Stuchlík, T. h. Stuchlíková, S. Bakardjieva, K. Hruška, A. Fejfar, J. Kočka
    The structure and growth mechanism of Si nanoneedles prepared by plasma-enhanced chemical vapor deposition
    Nanotechnology 21 (2010) 415604(1)-415604(7).
  24. J. Čermák, B. Rezek, V. Cimrová, A. Fejfar, A. Purkrt, M. Vaněček, J. Kočka
    Time-resolved opto-electronic properties of poly(3-hexylthiophene-2,5-dyil):fullerene heterostructures detected by Kelvin force microscopy
    Thin Solid Films 519 (2010) 836-840.
  25. A. Fejfar, A. Vetuško, V. Kalusová, O. Čertík, M. Ledinský, B. Rezek, J. Stuchlík, J. Kočka
    Relation of nanoscale and macroscopic properties of mixed-phase silicon thin films
    physica status solidi (a) 207 (2010) 582-586.
  26. P.C.P. Bronsveld, T. Mates, A. Fejfar, J. Kočka, J.K. Rath, R.E.I. Schropp
    High hydrogen dilution and low substrate temperature cause columnar growth of hydrogenated amorphous silicon
    physica status solidi (a) 207 (2010) 525-529.
  27. A. Vetuško, A. Fejfar, M. Ledinský, B. Rezek, J. Stuchlík, J. Kočka
    Comment on "Current routes in hydrogenated microcrystalline silicon"
    Physical Review B 81 (2010) 237301(1)-237301(4).
  28. A. Vetuško, A. Fejfar, M. Ledinský, B. Rezek, J. Stuchlík, J. Kočka
    Role of the tip induced local anodic oxidation in the conductive atomic force microscopy of mixed phase silicon thin films
    physica status solidi (c) 7 (2010) 728-731.
  29. M. Ledinský, A. Vetuško, J. Stuchlík, A. Fejfar, J. Kočka
    Raman mapping of microcrystalline silicon thin films with high spatial resolution
    physica status solidi (c) 7 (2010) 704-707.
  30. J. Červenka, M. Ledinský, T. h. Stuchlíková, J. Stuchlík, Z. Výborný, J. Holovský, K. Hruška, A. Fejfar, J. Kočka
    Ultrasharp Si nanowires produced by plasma-enhanced chemical vapor deposition
    Physica Status Solidi-Rapid Research Letters 4 (2010) 37-39.
  31. J. Stuchlík, M. Ledinský, S. Honda, I. Drbohlav, T. Mates, A. Fejfar, K. Hruška, T. h. Stuchlíková, J. Kočka
    LiF enhanced nucleation of the low temperature microcrystalline silicon prepared by plasma enhanced chemical vapour deposition.
    Thin Solid Films 517 (2009) 6829-6832.
  32. B. Rezek, E. Šípek, M. Ledinský, J. Stuchlík, A. Vetuško, J. Kočka
    Creating nanocrystals in amorphous silicon using a conductive tip
    Nanotechnology 20 (2009) 045302 (1)-045302 (6).
  33. J. Čermák, B. Rezek, A. Kromka, M. Ledinský, J. Kočka
    Electrochemical synthesis and electronic properties of polypyrrole on intrinsic diamond
    Diamond and Related Materials 18 (2009) 1098-1101.
  34. J. Kočka, T. h. Stuchlíková, M. Ledinský, J. Stuchlík, T. Mates, A. Fejfar
    Microcrystalline silicon, grain boundaries and role of oxygen.
    Solar Energy Materials and Solar Cells 93 (2009) 1444-1447.
  35. J. Kočka, A. Vetuško, A. Fejfar
    Some controversial points related to transport in microcrystalline silicon.
    Philosophical Magazine 89, 28-30 (2009) 2557-2571.
  36. A. Ogane, S. Honda, Y. Uraoka, T. Fuyuki, A. Fejfar, J. Kočka
    Crystallographic properties of grain size-controlled polycrystalline silicon thin films deposited on alumina substrate
    Journal of Crystal Growth 311 (2009) 789-793.
  37. B. Rezek, J. Čermák, A. Kromka, M. Ledinský, J. Kočka
    Photovoltage effects in polypyrrole-diamond nanosystem.
    Diamond and Related Materials 18 (2009) 249-252.
  38. J. Kočka, T. Mates, M. Ledinský, T. h. Stuchlíková, J. Stuchlík, A. Fejfar
    A simple quality factor for characterization of thin silicon films
    Journal of Non-Crystalline Solids 354 (2008) 2227-2230.
  39. A. Vetuško, M. Ledinský, J. Stuchlík, T. Mates, A. Fejfar, J. Kočka
    Mapping of mechanical stress in silicon thin films on silicon cantilevers by Raman microspectroscopy
    Journal of Non-Crystalline Solids 354 (2008) 2235-2237.
  40. B. Rezek, E. Šípek, M. Ledinský, P. Krejza, J. Stuchlík, A. Fejfar, J. Kočka
    Spatially localized current-induced crystallization of amorphous silicon films
    Journal of Non-Crystalline Solids 354 (2008) 2305-2309.
  41. J. Kočka, T. Mates, M. Ledinský, T. h. Stuchlíková, J. Stuchlík, A. Fejfar
    Properties of thin film silicon, prepared at high growth rate in a wide range of thicknesses
    Journal of Non-Crystalline Solids 354 (2008) 2451-2454.
  42. S. Honda, T. Mates, B. Rezek, A. Fejfar, J. Kočka
    Microscopic study of the H2O vapor treatment of the silicon grain boundaries.
    Journal of Non-Crystalline Solids 354 (2008) 2310-2313.
  43. T. Mates, A. Fejfar, B. Rezek, J. Kočka, P.C. P. Bronsveld, J.K. Rath, R.E.I.Schropp
    C-AFM and X-TEM: Studies of Mixed-Phase Silicon Thin Films.
    Imaging and Microscopy 10 (2008) 30-32.
  44. M. Ledinský, A. Vetuško, J. Stuchlík, T. Mates, A. Fejfar, J. Kočka, J. Štěpánek
    Crystallinity of the mixed phase silicon thin films by Raman spectroscopy.
    Journal of Non-Crystalline Solids 354 (2008) 2253-2257.
  45. J. Kočka, T. Mates, M. Ledinský, T. h. Stuchlíková, J. Stuchlík, A. Fejfar
    A simple tool for quality evaluation of the microcrystalline silicon prepared at high growth rate.
    Thin Solid Films 516 (2008) 4966-4969.
  46. J. Čermák, B. Rezek, V. Cimrová, D. Výprachtický, M. Ledinský, T. Mates, A. Fejfar, J. Kočka
    Correlation of atomic force microscopy detecting local conductivity and micro-Raman spectroscopy on polymer-fullerene composite films
    Physica Status Solidi-Rapid Research Letters 1 (5) (2007) 193-195.
  47. J. Kočka, T. Mates, M. Ledinský, J. Stuchlík, A. Fejfar, K. Gunnarsson
    Controlled growth of nanocrystalline silicon on permalloy micro-patterns
    Applied Physics A-Materials Science & Processing A 88 (2007) 797-800.
  48. T. Mates, P.C.P. Bronsveld, A. Fejfar, B. Rezek, J. Kočka, J.K. Rath, R.E.I. Schropp
    Structure of mixed-phase Si films studied by C-AFM and X-TEM.
    Journal of Physics: Conference Series 61 (2007) 790-794.
  49. L. Fekete, H. Němec, F. Kadlec, P. Kužel, J. Stuchlík, A. Fejfar, J. Kočka
    Carrier dynamics in microcrystalline silicon studied by time-resolved terahertz spectroscopy
    Journal of Non-Crystalline Solids 352 (2006) 2846-2849.
  50. S. Honda, T. Mates, K. Knížek, M. Ledinský, A. Fejfar, J. Kočka, T. Yamazaki, Y.Uraoka, T.Fuyuki
    Hydrogenation of polycrystalline silicon thin films
    Thin Solid Films 501 (2006) 144-148.