Influence of combined AFM/current measurement on local electronic properties of silicon thin films.
J. Non-Cryst. Solids 299-302 (2002) 360 - 363
Features of chrge carrier transport in mc-Si:H/a-Si:H superlattices
Mater. Sci. Forum 384-385 (2002) 301 - 304
G. Juška, K. Arlauskas, N. Nekrašas, J. Stuchlík, X. Niquille, N. Wyrch
Features of Charge carrier transport determined from carrier extraction current in uc-Si:H.
J. Non-Cryst. Solids 299-302 (2002) 375 - 379
Philosophical Magazine B (2002) 1785-1793.
Charge transport in microcrystalline Si- the specific features.
Sol. Energ. Mat. Sol. C. 66 (2001) 61 - 71
Transport Anisotropy in Microcrystalline Silicon Studied by Measurement of Ambipolar Diffusion Length.
J. Appl. Phys. 89 (2001) 1800 - 1805
Microcrystalline Silicon - Relation between Transport and Microstructure.
Solid State Phenom. 80-81 (2001) 213 - 224
Detection of bottom depletion layer and its influence on surface photovoltage measurement in uc-Si:H.
Thin Solid Films 383 (2001) 271 - 273
Amorphous/microcrystalline silicon superlattices - the chance to control isotropy and other transport properties.
Appl. Phys. Lett. 79 (2001) 2540 - 2542
Determination of Density of Localized States in a-Si:H from the Time Relaxation of Space-Charge-Limited Conductivity.
phys. status solidi a 187 (2001) 487 - 491
Features of Charge Carrier Transport in uc-Si:H/a-Si:H Superlattices.
in: Ultrafast Phenomena in Semiconductors, Materials Science Forum, Trans. Tech. Publ. 2001, p. 301-304, 2001, pp.
Local electronic transport in microcrystalline silicon observed by combined atomic force microscopy.
J. Non-Cryst. Solids 266-269 (2000) 309 - 314
Solar Energy Materials 8 (1983) 411-423.