1. M. Ondráček, P. Hapala, M. Švec, P. Jelínek
    Imaging Charge Distribution Within Molecules by Scanning Probe Microscopy
    Chapter 16 in Kelvin Probe Force Microscopy, eds. S. Sadewasser & T. Glatzel, Springer Series in Surface Sciences, vol. 65, Springer, Cham, 2018, pp. 499-518
  2. K. Kůsová, P. Hapala, P. Jelínek, I. Pelant
    Band Structure of Silicon Nanocrystals
    Chapter 4 in "Silicon Nanophotonics. Basic Principles, Present Status, and Perspectives". Second Edition, ed. by L. Khriachtchev, Pan Stanford Publishing 2016, pp 109-144.