1. Z. Hájková, M. Ledinský, A. Vetuško, J. Stuchlík, M. Müller, A. Fejfar, M. Bouša, M. Kalbáč, O. Frank
    Photovoltaic characterization of graphene/silicon Schottky junctions from local and macroscopic perspectives
    Chemical Physics Letters 676 (2017) 82-88.
  2. F. Lorenzo, A.B. Aebersold, M. Morales-Masis, M. Ledinský, S. Escrig, A. Vetuško, D.T.L. Alexander, A. Hessler-Wyser, A. Fejfar, C. Hébert, S. Nicolay, C. Ballif
    Direct Imaging of Dopant Distribution in Polycrystalline ZnO Films
    ACS Applied Materials and Interfaces 9 (2017) 7241-7248.
  3. C. Prastani, A. Vetuško, A. Fejfar, M. Nanu, D. Nanu, J. K. Rath, R. E. I. Schropp
    Conductivity mapping of nanoparticles by torsional resonance tunneling atomic force microscopy
    Applied Physics Letters 101 (2012) 083107(1)-083107(4).
  4. M. Ledinský, A. Fejfar, A. Vetuško, J. Stuchlík, J. Kočka
    Local photoconductivity of microcrystalline silicon thin films excited by 442 nm HeCd laser measured by conductive atomic force microscopy
    Journal of Non-Crystalline Solids 358 (2012) 2082-2085.
  5. A. Vetuško, T. Itoh, Y. Nakanishi, A. Fejfar, S. Nonomura, M. Ledinský, J. Kočka
    Conductive atomic force microscopy on carbon nanowalls
    Journal of Non-Crystalline Solids 358 (2012) 2545-2547.
  6. T. Itoh, Y. Nakanishi, T. Ito, A. Vetuško, M. Ledinský, A. Fejfar, J. Kočka, S. Nonomura
    Electrical properties of carbon nanowall films
    Journal of Non-Crystalline Solids 358 (2012) 2548-2551.