1. Z. Majzik, B. Drevniok, W. Kamiński, M. Ondráček, A. B. McLean, P. Jelínek
    Room Temperature Discrimination of Adsorbed Molecules and Attachment Sites on the Si(111)–7 × 7 Surface Using a qPlus Sensor
    ACS Nano 7 (2013) 2686-2692.
  2. J. Berger, M. Švec, M. Müller, M. Ledinský, A. Fejfar, P. Jelínek, Z. Majzik
    Characterization of the mechanical properties of qPlus sensors
    Beilstein Journal of Nanotechnology 4 (2013) 1-9.
  3. A. Yurtsever, Y. Sugimoto, H. Tanaka, M. Abe, S. Morita, M. Ondráček, P. Pou, R. Pérez, P. Jelínek
    Force mapping on a partially H-covered Si(111)-(7x7) surface: Influence of tip and surface reactivity
    Physical Review B 87 (2013) 155403(1)-155403(10).
  4. E. Abad, J. P Lewis, V. Zobač, P. Hapala, P. Jelínek, J. Ortega
    Calculation of non-adiabatic coupling vectors in a local-orbital basis set
    Journal of Chemical Physics 138 (2013) 154106(1)-154106(8).
  5. P. Hapala, K. Kůsová, I. Pelant, P. Jelínek
    Theoretical analysis of electronic band structure of 2- to 3-nm Si nanocrystals
    Physical Review B 87 (2013) 195420(1)-195420(13).
  6. A. J. Weymouth, D. Meuer, P. Mutombo, T. Wutscher, M. Ondráček, P. Jelínek, F. J. Giessibl
    Atomic Structure Affects the Directional Dependence of Friction
    Physical Review Letters 111 (2013) 126103(1)-126103(4).
  7. Y. Sugimoto, M. Ondráček, M. Abe, P. Pou, S. Morita, R. Pérez, F. Flores, P. Jelínek
    Quantum Degeneracy in Atomic Point Contacts Revealed by Chemical Force and Conductance
    Physical Review Letters 111 (2013) 106803(1)-106803(5).
  8. Y. Sugimoto, A. Yurtsever, M. Abe, S. Morita, M. Ondráček, P. Pou, R. Pérez, P. Jelínek
    Role of Tip Chemical Reactivity on Atom Manipulation Process in Dynamic Force Microscopy
    ACS Nano 7 (2013) 7370-7376.
  9. P. Sobotík, M. Setvín, P. Zimmermann, P. Kocán, I. Ošt’ádal, P. Mutombo, M. Ondráček, P. Jelínek
    Emergence of state at Fermi level due to the formation of In-Sn heterodimers on Si(100)-2×1
    Physical Review B 88 (2013) 205406(1)-205406(7).
  10. Z. Majzik, M.R. Tchalala, M. Švec, P. Hapala, H. Enriquez, A. Kara, A. J. Mayne, G. Dujardin, P. Jelínek, H. Oughaddou
    Combined AFM and STM measurements of a silicene sheet grown on the Ag(111) surface
    Journal of Physics: Condensed Matter 25 (2013) 225301(1)- 225301(6).
  11. W. Kaminski, W. Rozsíval, P. Jelínek
    Theoretical study of electronic and transport properties of PPy-Pt(111) and PPy-C(111):H interfaces
    Journal of Physics: Condensed Matter 22 (2010) 045003(1)-045003(10).
  12. S. Lindsay, J. He, O. Sankey, P. Hapala, P. Jelínek, P. Zhang, S.Chang, S. Huang
    Recognition tunneling
    Nanotechnology 21 (2010) 262001(1)-262001(12).
  13. C.Sánchez-Sánchez, C.González, P. Jelínek, J.Méndez, P.L.deAndres, J.A. Martín-Gago, M.F. López
    Understanding atomic-resolved STM images on TiO.2.(110)-(1x1) surface by DFT calculations.
    Nanotechnology 21 (2010) 405702(1)-405702(10).
  14. H. Vázquez, P. Jelínek, M. Brandbyge, A.P. Jauho, F. Flores
    Corrections to the density-functional theory electronic spectrum: copper phthalocyanine.
    Applied Physics A-Materials Science & Processing 95 (2009) 257-263.
  15. M. Švec, V. Dudr, M. Vondráček, P. Jelínek, P. Mutombo, V. Cháb, F. Šutara, V. Matolín, K. Prince
    Intra-atomic charge re-organization at the Pb Si interface: Bonding mechanism at low cover.
    Surface Science 603 (2009) 2861-2869.
  16. P. Pou, S.A. Ghasemi, P. Jelínek, T. Lenosky, S. Goedecker, R. Perez
    Structure and stability of semiconductor tip apexes for atomic force microscopy.
    Nanotechnology 20 (2009) 264015-1-264015-10.
  17. R. Bechstein, C. González, J. Schütte, P. Jelínek, R. Pérez, A. Kühnle
    'All-inclusive' imaging of the rutile TiO.2.(110) surface using NC-AFM.
    Nanotechnology 20 (2009) 505703(1)-505703(7).
  18. K. Košmider, A. Krupski, P. Jelínek, L. Jurczyszyn
    Atomic and electronic properties of the Pb/Mo(110) adsorption system.
    Physical Review B 80 (2009) 115424(1)-115424(7).
  19. S. Sadewasser, P. Jelínek, Ch.K. Fang, O.Custance, Y. Yamada, Y.Sugimoto, M.Abe, S.Morita
    New Insights on Atomic-Resolution Frequency-Modulation Kelvin-Probe Force-Microscopy Imaging of Semiconductors.
    Physical Review Letters 103 (2009) 266103(1)-266103(4).
  20. P. Pou, P. Jelínek, R. Pérez
    Basic Mechanisms for Single Atom Manipulation in Semiconductor Systems with the FM-AFM.
    Chapter 11 in Noncontact Atomic Force Microscopy, eds. S.Morita, F.J. Giessibl, R. Wiesendanger, in series NanoScience and Technology, vol. 2, Springer-Verlag Berlin Heidelberger 2009 pp. 227-248.