Luminescence Spectroscopy of Semiconductors
Oxford University Press, Oxford 2012.
560 pages | 330 b/w line drawings, 19 b/w halftones
ISBN 978-0-19-958833-6 | Hardback | 02 February 2012
Optics Express 20 (2012) 7071-7080.
K. Kůsová, L. Ondič, E. Klimešová, K. Herynková, I. Pelant, S. Daniš, J. Valenta, M. Gallart, M. Ziegler, B. Honerlage, P. Gilliot
Applied Physics Letters 101 (2012) 143101(1)-143101(5).
Journal of Applied Physics 112 (2012) 064322(1)-064322(5).
Scientific Reports 2 (2012) 914(1)-914(6).
V. Švrček, A. Slaoui, J. -C. Muller, J. -L. Rehspringer, B. Hönerlage, R. Tomasiunas, I. Pelant
Studies of silicon nanocrystals in phosphorus rich SiO2 matrices.
Physica E 16 (2003) 420 - 423
P. Fojtík, K. Perronet, I. Pelant, J. Chval, F. Charra
Photon emission from polycrystalline Ag induced by scanning tunneling microscopy: comparison of different tip materials.
Surf. Sci. 531 (2003) 113 - 122
J. Valenta, I. Pelant, K. Luterová, R. Tomasiunas, S. Cheylan, R. G. Elliman, J. Linnros, B. Hönerlage
Active planar optical waveguide made from luminescent silicon nanocrystals.
Appl. Phys. Lett. 82 (2003) 955 - 957
A. Fejfar, T. Mates, P. Fojtík, M. Ledinský, K. Luterová, T. h. Stuchlíková, I. Pelant, J. Kočka, V. Baumruk, A. Macková, M. Ito, K. Ro, H. Uyama
Japanese Journal of Applied Physics 242 (2003) L987- L989.
Solar Energy Materials and Solar Cells 78 (2003) 493-512.
R. Tomasiunas, J. Valenta, K. Luterová, I. Pelant, J. Čtyroký, B. Hönerlage
Study of wavequiding properties and optical gain in a luminescent layer of silicon nanocrystals
Lithuanian J. Phys. 43 (2003) 235 - 241
Thin Solid Films 383 (2001) 101-103.
Charge transport in microcrystalline Si- the specific features.
Sol. Energ. Mat. Sol. C. 66 (2001) 61 - 71
Transport Anisotropy in Microcrystalline Silicon Studied by Measurement of Ambipolar Diffusion Length.
J. Appl. Phys. 89 (2001) 1800 - 1805
Microcrystalline Silicon - Relation between Transport and Microstructure.
Solid State Phenom. 80-81 (2001) 213 - 224
A new approach to surface photovoltage measurements on hydrogenated microcrystalline silicon layers.
Philos. Mag. Lett. 81 (2001) 405 - 410
Detection of bottom depletion layer and its influence on surface photovoltage measurement in uc-Si:H.
Thin Solid Films 383 (2001) 271 - 273
J. Valenta, J. Dian, K. Luterová, I. Pelant, J. Buršík, D. Nižňanský
Electroluminescence from Sol-Gel Derived Film of CdS Nanocrystals.
phys. status solidi a 184 (2001) R1 - R3
Carrier diffusion in microcrystalline silicon studied by picosecond laser induced grating technique.
Appl. Phys. Lett. 79 (2001) 626 - 628
J. Mikulskas, R. Šulcas, E. Vanagas, R. Tomašiunas, K. Luterová, I. Pelant, J. -L. Rehspringer, R. Lévy
Si+ and Ge+ ion implanted SiO2 matrices: Photoluminiscence pecularities.
Lithuanian J. Phys. 41 (2001) 399 - 403