Publications

In the list of publications, you will find the complete output of our researchers since 1961.

  1. J. Kudrna, I. Pelant, J. Štěpánek, F. Trojánek, P. Malý
    Infrared picosecond absorption spectroscopy of microcrystalline silicon: separation between carrier recombination in crystalline and amorphous fractions.
    Appl. Phys. A-Mater. 74 (2002) 253 - 256
  2. V. Švrček, I. Pelant, P. Fojtík, J. Kočka, A. Fejfar, J. Toušek, M. Kondo, A. Matsuda
    Surface Photovoltage measurements in uc-Si:H: Manifestation of the bottom space charge region.
    J. Appl. Phys. 92 (2002) 2323 - 2329
  3. I. Pelant, P. Fojtík, K. Luterová, J. Kočka, A. Poruba, J. Štěpánek
    Electric-field-enhanced metal-induced crystallization of hydrogenated amorphous silicon at room temperature.
    Appl. Phys. A-Mater. 74 (2002) 557 - 560
  4. J. Šesták, Z. Chvoj
    Irreversible thermodynamics and true thermal state dynamics in view of generalised solid-state reaction kinetics.
    Thermochimica Acta 388 (2002) 427-439.
  5. V. Švrček, I. Pelant, J. -L. Rehspringer, P. Gilliot, D. Ohlmann, O. Grégut, B. Hönerlage, T. Chvojka, J. Valenta, J. Dian
    Photoluminescence properties of sol-gel derived SiO2 layers doped with porous silicon.
    Mat. Sci. Eng. C-Bio S. 19/1-2 (2002) 233 - 236
  6. J. Valenta, I. Pelant, J. Linnros
    Waveguiding effects in the measurement of optical gain in a layer of Si nanocrystal.
    Appl. Phys. Lett. 81 (2002) 1396 - 1398
  7. P. Shukrinov, A. Savchenkov, P. Mutombo, V. Cháb, J. Slezák
    Initial stages of adsorption in the Cu/Si(111) system.
    Surf. Sci. 506 (2002) 223 - 227
  8. A. Savchenkov, P. Shukrinov, P. Mutombo, J. Slezák, V. Cháb
    Initial stages of Cu/Si interface formation.
    Surf. Sci. 507-510 (2002) 889 - 894
  9. Microcrystalline silicon thin films studied by atomic force microscopy with electrical current detection.
    J. Appl. Phys. 92 (2002) 587 - 593
  10. Model of transport in microcrystalline silicon.
    J. Non-Cryst. Solids 299-302 (2002) 355 - 359
  11. Influence of combined AFM/current measurement on local electronic properties of silicon thin films.
    J. Non-Cryst. Solids 299-302 (2002) 360 - 363
  12. T. Mates, A. Fejfar, I. Drbohlav, B. Rezek, P. Fojtík, K. Luterová, J. Kočka, Ch. Koch, M. B. Schubert, M. Ito, K. Ro, H. Uyama
    Grains in protocrystalline silicon grown at very low substrate temperatures.
    J. Non-Cryst. Solids 299-302 (2002) 767 - 770
  13. A. Fejfar, T. Šikola
    International Summer School Role of Physics in Future Applications: From Nanotechnology to Macroelectronics.
    Thin Silicon Newsletter, publ. by aSiNet thematic network newsletter within EC growth programme, editor: J. Andreu, No.3 (2002), 1  ISSN 1579-4555 ., 2002, pp. 1  ISSN 1579-4555
  14. V. Švrček, A. Fejfar, P. Fojtík, T. Mates, A. Poruba, T. h. Stuchlíková, I. Pelant, J. Kočka, Y. Nasuno, M. Kondo, A. Matsuda
    Importance of the transport isotropy in uc-Si:H thin films for solar cells deposited at low substrate temperatures.
    J. Non-Cryst. Solids 299-302 (2002) 395 - 399
  15. T. Holec, T. Chvojka, I. Jelínek, J. Jindřich, I. Němec, I. Pelant, J. Valenta, J. Dian
    Determination of sensoric parameters of porous silicon in sensing of organic vapors.
    Mat. Sci. Eng. C-Bio S. 19 (2002) 251 - 254
  16. K. Luterová, I. Pelant, I. Mikulskas, R. Tomasiunas, D. Muller, J. -J. Grob, J. -L. Rehspringer, B. Hönerlage
    Stimulated emission in blue-emitting Si+-implanted SiO2 films?
    J. Appl. Phys. 91 (2002) 2896 - 2900
  17. G. Juška, N. Nekrašas, J. Stuchlík, K. Arlauskas, M. Viliunas, J. Kočka
    Features of chrge carrier transport in mc-Si:H/a-Si:H superlattices
    Mater. Sci. Forum 384-385 (2002) 301 - 304
  18. Journal of Chemical Physics 117 (2002) 8454-8466.
  19. O. Gedeon, K. Jurek
    Decay curve analysis of alkali-silicate glass exposed to electrons
    Microchimica Acta 139 (2002) 67-70.
  20. Journal of Physics D: Applied Physics 35 (2002) 2467-2471.
  21. M. Dlouhá, S. Vratislav, Z. Jirák, J. Hejtmánek, K. Knížek, D. Sedmidubský
    Applied Physics A-Materials Science & Processing 74 (2002) S673-S676.
  22. M. Muralidhar, S. Nariki, M. Jirsa, Y. Wu, M. Murakami
    Applied Physics Letters 80 (2002) 1016-1018.
  23. Y. Melikhov, C. C. H. Lo, A. Perevertov, J. Kadlecová, D. C. Jiles, I. Tomáš
    Journal of Physics D: Applied Physics 35 (2002) 413-422.
  24. G. Vértesy, I. Tomáš, Z. Vértesy
    Journal of Physics D: Applied Physics 35 (2002) 625-630.
  25. V. Zablotskyy, M. Jirsa, P. Petrenko
    Physical Review B 65 (2002) 224508(1)-224508(4).
  26. M. Muralidhar, N. Sakai, N. Chikumoto, M. Jirsa, T. Machi, M. Nishiyama, Y. Wu, M. Murakami
    Physical Review Letters 89 (2002) 237001(1)-237001(4).
  27. V. Kulikovsky, K. Metlov, A. Kurdyumov, P. Boháč, L. Jastrabík
    Diamond and Related Materials 11 (2002) 1467-1471.
  28. M. Muralidhar, N. Sakai, Y. Wu, M. Murakami, M. Jirsa, T. Nishizaki, N. Kobayashi
    Superconductor Science and Technology 15 (2002) 1357-1363.
  29. M. Muralidhar, M. Jirsa, N. Sakai, M. Murakami
    Superconductor Science and Technology 15 (2002) 688-693.
  30. M. Muralidhar, S. Nariki, M. Jirsa, M. Murakami
    Physica C: Superconductivity 372-376 (2002) 1134-1136.
  31. M. Jirsa, V. Yurchenko, V. Novák, P. Kováč, I. Hušek
    Physica C: Superconductivity 372-376 (2002) 1855-1858.
  32. M. Muralidhar, N. Sakai, M. Jirsa, M. Murakami
    Physica C: Superconductivity 378-381 (2002) 648-650.
  33. M. Jirsa, V. Zablotskyy, M. Muralidhar, K. Iida, M. Murakami
    Physica C: Superconductivity 378-381 (2002) 707-712.
  34. M. Muralidhar, M. Jirsa, Y. Wu, M. Murakami
    Physica C: Superconductivity 378-381 (2002) 742-745.
  35. M. Muralidhar, S. Nariki, M. Jirsa, M. Murakami
    Physica C: Superconductivity 378-381 (2002) 746-749.
  36. M. Muralidhar, M. Jirsa, N. Sakai, M. Murakami
    Physica C: Superconductivity 378-381 (2002) 750-754.
  37. R. Meckenstock, D. Spoddig, K. Himmelbauer, H. Krenn, M. Doi, W. Keune, Z. Frait, J. Pelzl
    Journal of Magnetism and Magnetic Materials 240 (2002) 410-413.
  38. O. Vávra, Š. Gaži, J. Bydžovský, J. Dérer, E. Kováčová, Z. Frait, M. Maryško, I. Vávra
    Journal of Magnetism and Magnetic Materials 240 (2002) 583-585.
  39. V. Železný, E. Cockayne, J. Petzelt, M.F. Limonov, D.E. Usvyat, V.V. Lemanov, A.A. Volkov
    Physical Review B 66 (2002) 224303(1) -224303(12).
  40. T. Ostapčuk, J. Petzelt, V. Železný, A. Pashkin, I. Drbohlav, P. Kužel, D. Rafaja, B.P. Gorshunov, M. Dressel, C. Ohly, S. Hoffmann-Eifert, R. Waser
    Physical Review B 66 (2002) 235406(1) -235406(12).
  41. Surface Science 507-510 (2002) 108-113.
  42. F. Nieto, A. Tarasenko, C. Uebing
    Physical Chemistry Chemical Physics 4 (2002) 1882-1888.
  43. F. Nieto, A. Tarasenko, C.Uebing
    Applied Surface Science 196 (2002) 181-190.
  44. J. Bulíř, M. Novotný, M. Jelínek, J. Lančok, Z. Zelinger, M. Trchová
    Pulsed laser deposition of CNx films: role of r.f. nitrogen plasma activation for the film structure formation
    Diamond and Related Materials 11 (2002) 1223-1226.
  45. M. Jelínek, J. Lančok, M. Pavelka, P.A. Atanasov, A. Macková, F. Flory, C. Garapon
    Applied Physics A-Materials Science & Processing A74 (2002) 481-485.
  46. Physical Review B 65 (2002) 155329(1)-155329(23).
  47. V. Špirko, A. Čejchan, R. Lutchyn, J. Leszczynski
    Chemical Physics Letters 355 (2002) 319-326.
  48. Advanced Mathematical Methods with Maple (D. Richards, Cambridge University Press, 2002, 862 stran)
    Československý časopis pro fyziku 5 (2002) 309-.
  49. T. Pencheva, M. Nenkov, M. Jelínek, J. Lančok, J. Bulíř, A. Dejneka, Xu CN
    Determination of optical properties of PLZT thin films using transmittance spectra processing.
    INTERNATIONAL CONFERENCE ON ADVANCED LASER TECHNOLOGIES Book Series: PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE)
  50. A. Dejneka, P. Pokorný, L. Jastrabík, G. Suchaneck, G. Gerlach
    Temperature dependent spectral ellipsometry - a powerful technique for thin film investigations.
    FIRST INTERNATIONAL WORKSHOP ON CLASSICAL AND QUANTUM INTERFERENCE Book Series: PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE)