I specialize in advanced methods of atomic force microscopy (AFM) with emphasis on photovoltaic materials and structures. The main topic of my research is theory and applications of conductive AFM and its less-common variations; C-AFM tomography, scalpel C-AFM and SSRM. These methods allow for mapping of the local conductivity of the materials on the nanometer scale. I have used it to study a large scale of silicon-based structures and materials for photovoltaics, from polycrystalline silicon grain boundaries to silicon nanowires or multilayered selective contacts used in record solar cells.


ORCID 0000-0002-6805-7260
Scopus Author ID: 56404622600