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  2. Optical characterization

Optical characterization

Time-resolved cathodoluminescence setup with cooling stage

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Scintillation decays measured with ps time resolution

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Rentgenová trubice: N5084, Hamamatsu (40 kV)

Optical polarizing microscope NIKON Eclipse E600Pol

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Optický polarizační mikroskop NIKON

Photoelastic modulator PEM 100 firmy HINDS Instruments

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Vacuum UV spectrometer

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Vacuum UV spectrometer

Intensified CCD camera

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Intensified CCD camera

Tunable femtosecond laser system

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Tunable femtosecond laser system

Streak Camera

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Streak camera 2

Scatterometer – Measurement of surface roughness by laser beam scattering characteristics

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