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  4. Division of Solid State Physics
  5. Department of Thin Films and Nanostructures
  6. Raman laboratory
  7. Results

Raman laboratory

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Temperature Dependence of the Urbach Energy in Lead Iodide Perovskites

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Porovnání hustoty defektů různých polovodičů

Charge Carrier Injection Electroluminescence with CO-functionalized Tips on Single Molecular Emitters

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Figures - Correlating light and force maps on single molecules.png

Enhanced Extraction of Silicon-Vacancy Centers Light Emission Using Bottom-Up Engineered Polycrystalline Diamond Photonic Crystal Slabs

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vv-11.jpg

Development of the method – Silicon thin film profilometry using Raman spectroscopy

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a) Raman spectra measured on the a-Si:H stripe (blue line) and on an uncovered part of the flat c-Si wafer (orange line); b) Sketch of the test sample; c) Corresponding Raman map of c-Si integral intensities integrated over 505-535 cm-1 range.
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