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X-ray Difraktometr Bruker D8 Advance
Bruker D8 Advance is an X-ray (CuKα radiation) powder diffractometer with Bragg-Brentano geometry for phase and structure analysis of materials. It is equipped with position-sensitive LYNXEYE XE-T detector possessing energy resolution better than 380 eV. The low temperature structural characterization over the range 12-300 K can be realized using the Phenix closed cycle helium cryostat. The determination of the crystallite (grain) size of nano-materials (3-300 nm) and preferred orientation (texture) of solid samples or thin films can be also achieved.