Transmission electron microscope Jeol JEM-1200EX

Transmisní elektronový mikroskop Jeol JEM-1200EX
Regime
user access
Category
Characterisation and testing > Electron Microscopy
Inclusion to structure
Laboratory of electron microscopy
Contact person
Ing. Petr Svora, Ph.D.
Manufacturer
JEOL Ltd.
Reservation system
Database of costly devices FZU

Transmission electron microscope Jeol JEM-1200EX allows for characterization of samples using conventional electron microscopy methods (bright/dark field imaging and electron diffraction) as well as conducting in-situ experiments (sample toughness under strain, dynamical observation of dislocations) at room and elevated (up to 300°C)  temperature.