Introduction to magneto-optical spectroscopic ellipsometry measurements

The seminar will provide an introduction to magneto-optical phenomena, how they can be studied using spectroscopic ellipsometry with its basic principles and instrumentation. Regression analyses of the ellipsometry data allow for a calculation of material properties, such as the relative permittivity tensor elements. To gain further insight into the electronic structure of the studied material, obtained permittivity tensor spectra can be either fitted to semiclassical theory predictions or compared to ab initio calculations. In the end, new findings on thin epitaxial NMG films prepared by magnetron sputtering will be presented, in particular, the effects of martensitic transformation and substrate-induced strain relaxation on optical and magneto-optical responses.