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Instruments
NanoESCA
Scanning Tunneling Microscopy
Magneto-optics
NanoESCA (Omicron)
  Lateral resolution  
  Energy resolution  
  PEEM  
  ~50nm  
  ~100meV  
  XPS/ESCA  
  ~500nm
  0.1-0.5eV  
  k-PEEM  
  ~50μm
  ~100meV  
Light sources:
He-lamp, Hg-lamp, and Al K
α
Applications:
- Local chemical analysis
- Work function mapping (~50 nm resolution)
- Fast ARPES snapshot mode
- Dark-Field PEEM
Contact
Dr. Jan Honolka
ORCID
Inst. of Physics (FZU)
Na Slovance 2
CZ-182 21, Prague 8
(+420) 26605 2389
honolka@fzu.cz
Links
>>Institute of Physics (ASCR)
>>SAFMAT