Publikace

Ve výpisu publikací najdete všechny důležité publikační výsledky výzkumu a vývoje našich vědeckých pracovníků od roku 1961.

  1. M. Dlouhá, S. Vratislav, Z. Jirák, J. Hejtmánek, K. Knížek, D. Sedmidubský
    Applied Physics A-Materials Science & Processing 74 (2002) S673-S676.
  2. O. Špalek, V. Jirásek, M. Čenský, J. Kodymová, I. Jakubec, G.D. Hager
    Chemical generation of atomic iodine for the chemical-oxygen iodine laser: Experimental results
    Chem. Phys. 282 (2002) 147
  3. P. Malý, F. Trojánek, T. Miyoshi, K. Yamanaka, K. Luterová, I. Pelant, P. Němec
    Ultrafast carrier dynamics in CdSe nanocrystalline films on crystalline silicon substrate.
    Thin Solid Films 403-404 (2002) 462 - 466
  4. J. Kudrna, I. Pelant, J. Štěpánek, F. Trojánek, P. Malý
    Infrared picosecond absorption spectroscopy of microcrystalline silicon: separation between carrier recombination in crystalline and amorphous fractions.
    Appl. Phys. A-Mater. 74 (2002) 253 - 256
  5. V. Švrček, I. Pelant, P. Fojtík, J. Kočka, A. Fejfar, J. Toušek, M. Kondo, A. Matsuda
    Surface Photovoltage measurements in uc-Si:H: Manifestation of the bottom space charge region.
    J. Appl. Phys. 92 (2002) 2323 - 2329
  6. I. Pelant, P. Fojtík, K. Luterová, J. Kočka, A. Poruba, J. Štěpánek
    Electric-field-enhanced metal-induced crystallization of hydrogenated amorphous silicon at room temperature.
    Appl. Phys. A-Mater. 74 (2002) 557 - 560
  7. J. Šesták, Z. Chvoj
    Irreversible thermodynamics and true thermal state dynamics in view of generalised solid-state reaction kinetics.
    Thermochimica Acta 388 (2002) 427-439.
  8. V. Švrček, I. Pelant, J. -L. Rehspringer, P. Gilliot, D. Ohlmann, O. Grégut, B. Hönerlage, T. Chvojka, J. Valenta, J. Dian
    Photoluminescence properties of sol-gel derived SiO2 layers doped with porous silicon.
    Mat. Sci. Eng. C-Bio S. 19/1-2 (2002) 233 - 236
  9. J. Valenta, I. Pelant, J. Linnros
    Waveguiding effects in the measurement of optical gain in a layer of Si nanocrystal.
    Appl. Phys. Lett. 81 (2002) 1396 - 1398
  10. P. Shukrinov, A. Savchenkov, P. Mutombo, V. Cháb, J. Slezák
    Initial stages of adsorption in the Cu/Si(111) system.
    Surf. Sci. 506 (2002) 223 - 227
  11. A. Savchenkov, P. Shukrinov, P. Mutombo, J. Slezák, V. Cháb
    Initial stages of Cu/Si interface formation.
    Surf. Sci. 507-510 (2002) 889 - 894
  12. Microcrystalline silicon thin films studied by atomic force microscopy with electrical current detection.
    J. Appl. Phys. 92 (2002) 587 - 593
  13. Model of transport in microcrystalline silicon.
    J. Non-Cryst. Solids 299-302 (2002) 355 - 359
  14. Influence of combined AFM/current measurement on local electronic properties of silicon thin films.
    J. Non-Cryst. Solids 299-302 (2002) 360 - 363
  15. T. Mates, A. Fejfar, I. Drbohlav, B. Rezek, P. Fojtík, K. Luterová, J. Kočka, Ch. Koch, M. B. Schubert, M. Ito, K. Ro, H. Uyama
    Grains in protocrystalline silicon grown at very low substrate temperatures.
    J. Non-Cryst. Solids 299-302 (2002) 767 - 770
  16. P. Fojtík, K. Dohnalová, T. Mates, J. Stuchlík, I. Gregora, J. Chval, A. Fejfar, J. Kočka, I. Pelant
    Philosophical Magazine B (2002) 1785-1793.
  17. A. Fejfar, T. Šikola
    International Summer School Role of Physics in Future Applications: From Nanotechnology to Macroelectronics.
    Thin Silicon Newsletter, publ. by aSiNet thematic network newsletter within EC growth programme, editor: J. Andreu, No.3 (2002), 1  ISSN 1579-4555 ., 2002, pp. 1  ISSN 1579-4555
  18. V. Švrček, A. Fejfar, P. Fojtík, T. Mates, A. Poruba, T. h. Stuchlíková, I. Pelant, J. Kočka, Y. Nasuno, M. Kondo, A. Matsuda
    Importance of the transport isotropy in uc-Si:H thin films for solar cells deposited at low substrate temperatures.
    J. Non-Cryst. Solids 299-302 (2002) 395 - 399
  19. T. Holec, T. Chvojka, I. Jelínek, J. Jindřich, I. Němec, I. Pelant, J. Valenta, J. Dian
    Determination of sensoric parameters of porous silicon in sensing of organic vapors.
    Mat. Sci. Eng. C-Bio S. 19 (2002) 251 - 254
  20. K. Luterová, I. Pelant, I. Mikulskas, R. Tomasiunas, D. Muller, J. -J. Grob, J. -L. Rehspringer, B. Hönerlage
    Stimulated emission in blue-emitting Si+-implanted SiO2 films?
    J. Appl. Phys. 91 (2002) 2896 - 2900
  21. G. Juška, N. Nekrašas, J. Stuchlík, K. Arlauskas, M. Viliunas, J. Kočka
    Features of chrge carrier transport in mc-Si:H/a-Si:H superlattices
    Mater. Sci. Forum 384-385 (2002) 301 - 304
  22. Journal of Chemical Physics 117 (2002) 8454-8466.
  23. O. Gedeon, K. Jurek
    Decay curve analysis of alkali-silicate glass exposed to electrons
    Microchimica Acta 139 (2002) 67-70.
  24. Module Controller Chip for the ATLAS Pixel Detector
    Nuclear Instruments and Methods in Physics Research A 492 (2002) 117-133.
  25. M. Muralidhar, S. Nariki, M. Jirsa, Y. Wu, M. Murakami
    Applied Physics Letters 80 (2002) 1016-1018.
  26. Y. Melikhov, C. C. H. Lo, A. Perevertov, J. Kadlecová, D. C. Jiles, I. Tomáš
    Journal of Physics D: Applied Physics 35 (2002) 413-422.
  27. G. Vértesy, I. Tomáš, Z. Vértesy
    Journal of Physics D: Applied Physics 35 (2002) 625-630.
  28. V. Zablotskyy, M. Jirsa, P. Petrenko
    Physical Review B 65 (2002) 224508(1)-224508(4).
  29. M. Muralidhar, N. Sakai, N. Chikumoto, M. Jirsa, T. Machi, M. Nishiyama, Y. Wu, M. Murakami
    Physical Review Letters 89 (2002) 237001(1)-237001(4).
  30. V. Kulikovsky, K. Metlov, A. Kurdyumov, P. Boháč, L. Jastrabík
    Diamond and Related Materials 11 (2002) 1467-1471.
  31. M. Muralidhar, N. Sakai, Y. Wu, M. Murakami, M. Jirsa, T. Nishizaki, N. Kobayashi
    Superconductor Science and Technology 15 (2002) 1357-1363.
  32. S. N. Kane, D. Rodionov, B. Bernhardt, L. Kraus, G. Klingelhöfer
    Hyperfine Interactions 144-145 (2002) 273-278.
  33. M. Muralidhar, M. Jirsa, N. Sakai, M. Murakami
    Superconductor Science and Technology 15 (2002) 688-693.
  34. F. Fendrych, L. Kraus, O. Chayka, P. Lobotka, I. Vavra, J. Tous, V. Studnicka, Z. Frait
    Monatshefte für Chemie 133 (2002) 773-784.
  35. L. Kraus, P. Švec, J. Bydžovský
    Journal of Magnetism and Magnetic Materials 242-245 (2002) 241-243.
  36. L. Kraus, F. Fendrych, P. Švec, J. Bydžovský, M. Kollár
    Cobalt-rich amorphous ribbons for strain sensing in civil engineering
    Journal of Optoelectronics and Advanced Materials 4 (2002) 237-243.
  37. M. Muralidhar, S. Nariki, M. Jirsa, M. Murakami
    Physica C: Superconductivity 372-376 (2002) 1134-1136.
  38. M. Jirsa, V. Yurchenko, V. Novák, P. Kováč, I. Hušek
    Physica C: Superconductivity 372-376 (2002) 1855-1858.
  39. M. Muralidhar, N. Sakai, M. Jirsa, M. Murakami
    Physica C: Superconductivity 378-381 (2002) 648-650.
  40. M. Jirsa, V. Zablotskyy, M. Muralidhar, K. Iida, M. Murakami
    Physica C: Superconductivity 378-381 (2002) 707-712.
  41. M. Muralidhar, M. Jirsa, Y. Wu, M. Murakami
    Physica C: Superconductivity 378-381 (2002) 742-745.
  42. M. Muralidhar, S. Nariki, M. Jirsa, M. Murakami
    Physica C: Superconductivity 378-381 (2002) 746-749.
  43. M. Muralidhar, M. Jirsa, N. Sakai, M. Murakami
    Physica C: Superconductivity 378-381 (2002) 750-754.
  44. R. Meckenstock, D. Spoddig, K. Himmelbauer, H. Krenn, M. Doi, W. Keune, Z. Frait, J. Pelzl
    Journal of Magnetism and Magnetic Materials 240 (2002) 410-413.
  45. P. Lobotka, I. Vavra, F. Fendrych, L. Kraus
    Journal of Magnetism and Magnetic Materials 240 (2002) 491-493.
  46. O. Vávra, Š. Gaži, J. Bydžovský, J. Dérer, E. Kováčová, Z. Frait, M. Maryško, I. Vávra
    Journal of Magnetism and Magnetic Materials 240 (2002) 583-585.
  47. J. P. Sinnecker, K. R. Pirota, M. Knobel, L. Kraus
    Journal of Magnetism and Magnetic Materials 249 (2002) 16-21.
  48. J. Bydžovský, M. Kolár, V. Jančárik, P. Švec, L. Kraus
    Czechoslovak Journal of Physics 52 (2002) A117-A120.
  49. V. Jančárik, P. Švec, L. Kraus
    Strain sensor system based on amorphous ferromagnetic ribbons
    Journal of Electrical Engineering 53 (2002) 92-94.
  50. J. Paĺa, J. Bydžovský, L. Kraus, P. Švec
    Influence of DC magnetic field on accuracy of magnetoelastic strain sensors
    Journal of Electrical Engineering 53 (2002) 103-106.