Wavelength dispersive X-ray fluorescence (WD-XRF) spectrometer for thin film applications

Typ
Below-threshold public contract for supplies contracted within a simplified below-threshold procedure
Zveřejněno na webu FZÚ
Lhůta pro podání nabídky
Kontaktní osoba
Mgr. Václav Kafka
Telefon
+420 266052751
E-mail
kafkav [at] fzu.cz
Zástupce kontaktní osoby
Vladimír Levandovský
Telefon zástupce
+420 266052591
E-mail zástupce
levandovsky@fzu.cz

TThe subject matter of this public contract is supply (acquisition) of a wavelength dispersive X-ray fluorescence spectrometer for thin film applications. It will be used to analyze the chemical composition of thin film multilayers with typical thicknesses between 10 and 100nm composed of elements from N to Bi.

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