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Semináře a workshopy oddělení 27

Seminář / Středa, 19.02.2020 13:30

The M6 is the latest generation of high-end TOF-SIMS instruments developed by IONTOF. Its design guarantees superior performance in all fields of SIMS applications. New ground-breaking ion beam and mass analyser technoligies make the M6 the benchmark in SIMS instrumentation and the ideal tool for industrial and academic research.

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