1. P. Galář, J. Stuchlík, M. Müller, J. Kočka, K. Kůsová
    Highly spherical SiC nanoparticles grown in nonthermal plasma
    Plasma Processes and Polymers tba (2022) e2100127(1)-e2100127(10).
  2. M. Hývl, M. Müller, T. h. Stuchlíková, J. Stuchlík, M. Šilhavík, J. Kočka, A. Fejfar, J. Červenka
    Nucleation and growth of metal-catalyzed silicon nanowires under plasma
    Nanotechnology 31 (2020) 225601(1)-225601(11).
  3. M. Müller, P. Galář, J. Stuchlík, J. Kočka, Jonáš Kupka, K. Kůsová
    Synthesis and surface modification of light emitting silicon nanoparticles using non-thermal plasma techniques
    European Physical Journal - Applied Physics 89 (2020) 20401(1)-20401(6).
  4. M. Šilhavík, M. Müller, J. Stuchlík, T. h. Stuchlíková, M. Klementová, J. Kočka, A. Fejfar, J. Červenka
    Comparative study of catalyst-induced doping and metal incorporation in silicon nanowires
    Applied Physics Letters 114 (2019) 132103(1)-132103(5).
  5. M. Müller, M. Ledinský, J. Kočka, A. Fejfar, J. Červenka
    Effects of nanowire size and geometry on silicon nanowire array thin film solar cells
    Journal of Vacuum Science and Technology B 36 (2018) 011401(1)-011401(6).
  6. J. Kočka, M. Müller, J. Stuchlík, T. h. Stuchlíková, J. Červenka, A. Fejfar
    Role of a-Si:H in lateral growth of crystalline silicon nanowires using Pb and In catalysts
    physica status solidi (a) 1-5 (2016) (1)-(5).
  7. M. Müller, J. Kočka, A. Fejfar, J. Červenka
    Silicon Nanowire Array for Thin Film Solar Cells
    Aceees 2016
  8. A. Fejfar, M. Hývl, A. Vetuško, P. Pikna, Z. Hájková, M. Ledinský, J. Kočka, P. Klapetek, A. Marek, A. Mašková, J. Vyskočil, J. Merkel, C. Becker, T. Itoh, S. Misra, M. Foldyna, L. Yu, P. Roca i Cabarrocas
    Correlative microscopy of radial junction nanowire solar cells using nanoindent position markers
    Solar Energy Materials and Solar Cells 135 (2015) 106-112.
  9. M. Müller, M. Hývl, M. Kratzer, C. Teichert, S. Misra, M. Foldyna, L. Yu, P. Roca i Cabarrocas, T. Itoh, Z. Hájková, A. Vetuško, M. Ledinský, J. Kočka, A. Fejfar
    Investigating inhomogeneous electronic properties of radial junction solar cells using correlative microscopy
    Japanese Journal of Applied Physics 54 (2015) 08KA08-1-08KA08-5.
  10. Š. Potocký, J. Holovský, Z. Remeš, M. Müller, J. Kočka, A. Kromka
    Si-related color centers in nanocrystalline diamond thin films
    physica status solidi (b) 251 (2014) 2603-2606.
  11. B. Stegemann, J. Čermák, B. Rezek, J. Kočka, M. Schmidt
    Silicon Nanodot Layers for Photovoltaic Application: Size/Density Control and Electrical Properties
    Zeitschrift für Physikalische Chemie 228 (2014) 543-556.
  12. M. Müller, J. Kočka, H. G. El Gohary, J. Stuchlík, T. h. Stuchlíková, K. Hruška, B. Rezek, M. Ledinský, A. Fejfar
    Preparation and testing of silicon nanowires
    Canadian Journal of Physics 7/8 (2014) 819-821.
  13. A. Fejfar, M. Hývl, M. Ledinský, A. Vetuško, J. Stuchlík, J. Kočka, S. Misra, B. O'Donnell, M. Foldyna, Linwei Yu, P. Roca i Cabarrocas
    Microscopic measurements of variations in local (photo)electronic properties in nanostructured solar cells
    Solar Energy Materials and Solar Cells 119 (2013) 228-234.
  14. E. Verveniotis, E. Šípek, J. Stuchlík, J. Kočka, B. Rezek
    Generating ordered Si nanocrystals via atomic force microscopy
    Journal of Non-Crystalline Solids 358 (2012) 2118-2121.
  15. M. Ledinský, A. Fejfar, A. Vetuško, J. Stuchlík, J. Kočka
    Local photoconductivity of microcrystalline silicon thin films excited by 442 nm HeCd laser measured by conductive atomic force microscopy
    Journal of Non-Crystalline Solids 358 (2012) 2082-2085.
  16. A. Vetuško, T. Itoh, Y. Nakanishi, A. Fejfar, S. Nonomura, M. Ledinský, J. Kočka
    Conductive atomic force microscopy on carbon nanowalls
    Journal of Non-Crystalline Solids 358 (2012) 2545-2547.
  17. T. Itoh, Y. Nakanishi, T. Ito, A. Vetuško, M. Ledinský, A. Fejfar, J. Kočka, S. Nonomura
    Electrical properties of carbon nanowall films
    Journal of Non-Crystalline Solids 358 (2012) 2548-2551.
  18. J. Kočka
    Relation of defects and grain boundaries to transport and photo-transport: Solved and unsolved problems in microcrystalline silicon
    Journal of Non-Crystalline Solids 358 (2012) 1946-1953.
  19. B. Rezek, J. Čermák, A. Kromka, M. Ledinský, P. Hubík, J. J. Mareš, A. Purkrt, V. Cimrová, A. Fejfar, J. Kočka
    Synthesis, structure, and opto-electronic properties of organic-based nanoscale heterojunctions
    Nanoscale Research Letters 6 (2011) 238(1)-238(12).
  20. M. Ledinský, A. Fejfar, A. Vetuško, J. Stuchlík, B. Rezek, J. Kočka
    Local photoconductivity of microcrystalline silicon thin films measured by conductive atomic force microscopy
    Physica Status Solidi-Rapid Research Letters 5 (2011) 373-375.
  21. E. Verveniotis, B. Rezek, E. Šípek, J. Stuchlík, M. Ledinský, J. Kočka
    Impact of AFM-induced nano-pits in a-Si:H films on silicon crystal growth
    Nanoscale Research Letters 6 (2011) 145(1)-145(6).
  22. J. Červenka, M. Ledinský, T. h. Stuchlíková, J. Stuchlík, Z. Výborný, J. Holovský, K. Hruška, A. Fejfar, J. Kočka
    Ultrasharp Si nanowires produced by plasma-enhanced chemical vapor deposition
    Physica Status Solidi-Rapid Research Letters 4 (2010) 37-39.
  23. A. Fejfar, A. Vetuško, V. Kalusová, O. Čertík, M. Ledinský, B. Rezek, J. Stuchlík, J. Kočka
    Relation of nanoscale and macroscopic properties of mixed-phase silicon thin films
    physica status solidi (a) 207 (2010) 582-586.
  24. P.C.P. Bronsveld, T. Mates, A. Fejfar, J. Kočka, J.K. Rath, R.E.I. Schropp
    High hydrogen dilution and low substrate temperature cause columnar growth of hydrogenated amorphous silicon
    physica status solidi (a) 207 (2010) 525-529.
  25. A. Vetuško, A. Fejfar, M. Ledinský, B. Rezek, J. Stuchlík, J. Kočka
    Comment on "Current routes in hydrogenated microcrystalline silicon"
    Physical Review B 81 (2010) 237301(1)-237301(4).
  26. A. Vetuško, A. Fejfar, M. Ledinský, B. Rezek, J. Stuchlík, J. Kočka
    Role of the tip induced local anodic oxidation in the conductive atomic force microscopy of mixed phase silicon thin films
    physica status solidi (c) 7 (2010) 728-731.
  27. M. Ledinský, A. Vetuško, J. Stuchlík, A. Fejfar, J. Kočka
    Raman mapping of microcrystalline silicon thin films with high spatial resolution
    physica status solidi (c) 7 (2010) 704-707.
  28. J. Čermák, B. Rezek, V. Cimrová, A. Fejfar, A. Purkrt, M. Vaněček, J. Kočka
    Time-resolved opto-electronic properties of poly(3-hexylthiophene-2,5-dyil):fullerene heterostructures detected by Kelvin force microscopy
    Thin Solid Films 519 (2010) 836-840.
  29. E. Verveniotis, B. Rezek, E. Šípek, J. Stuchlík, J. Kočka
    Role of current profiles and atomic force microscope tips on local lectric crystallization of amorphous silicon
    Thin Solid Films 518 (2010) 5965-5970.
  30. J. Červenka, M. Ledinský, J. Stuchlík, T. h. Stuchlíková, S. Bakardjieva, K. Hruška, A. Fejfar, J. Kočka
    The structure and growth mechanism of Si nanoneedles prepared by plasma-enhanced chemical vapor deposition
    Nanotechnology 21 (2010) 415604(1)-415604(7).
  31. A. Ogane, S. Honda, Y. Uraoka, T. Fuyuki, A. Fejfar, J. Kočka
    Crystallographic properties of grain size-controlled polycrystalline silicon thin films deposited on alumina substrate
    Journal of Crystal Growth 311 (2009) 789-793.
  32. B. Rezek, J. Čermák, A. Kromka, M. Ledinský, J. Kočka
    Photovoltage effects in polypyrrole-diamond nanosystem.
    Diamond and Related Materials 18 (2009) 249-252.
  33. J. Čermák, B. Rezek, A. Kromka, M. Ledinský, J. Kočka
    Electrochemical synthesis and electronic properties of polypyrrole on intrinsic diamond
    Diamond and Related Materials 18 (2009) 1098-1101.
  34. J. Kočka, T. h. Stuchlíková, M. Ledinský, J. Stuchlík, T. Mates, A. Fejfar
    Microcrystalline silicon, grain boundaries and role of oxygen.
    Solar Energy Materials and Solar Cells 93 (2009) 1444-1447.
  35. J. Kočka, A. Vetuško, A. Fejfar
    Some controversial points related to transport in microcrystalline silicon.
    Philosophical Magazine 89, 28-30 (2009) 2557-2571.
  36. B. Rezek, E. Šípek, M. Ledinský, J. Stuchlík, A. Vetuško, J. Kočka
    Creating nanocrystals in amorphous silicon using a conductive tip
    Nanotechnology 20 (2009) 045302 (1)-045302 (6).
  37. J. Stuchlík, M. Ledinský, S. Honda, I. Drbohlav, T. Mates, A. Fejfar, K. Hruška, T. h. Stuchlíková, J. Kočka
    LiF enhanced nucleation of the low temperature microcrystalline silicon prepared by plasma enhanced chemical vapour deposition.
    Thin Solid Films 517 (2009) 6829-6832.
  38. T. Mates, A. Fejfar, B. Rezek, J. Kočka, P.C. P. Bronsveld, J.K. Rath, R.E.I.Schropp
    C-AFM and X-TEM: Studies of Mixed-Phase Silicon Thin Films.
    Imaging and Microscopy 10 (2008) 30-32.
  39. M. Ledinský, A. Vetuško, J. Stuchlík, T. Mates, A. Fejfar, J. Kočka, J. Štěpánek
    Crystallinity of the mixed phase silicon thin films by Raman spectroscopy.
    Journal of Non-Crystalline Solids 354 (2008) 2253-2257.
  40. J. Kočka, T. Mates, M. Ledinský, T. h. Stuchlíková, J. Stuchlík, A. Fejfar
    A simple tool for quality evaluation of the microcrystalline silicon prepared at high growth rate.
    Thin Solid Films 516 (2008) 4966-4969.
  41. S. Honda, T. Mates, B. Rezek, A. Fejfar, J. Kočka
    Microscopic study of the H2O vapor treatment of the silicon grain boundaries.
    Journal of Non-Crystalline Solids 354 (2008) 2310-2313.
  42. J. Kočka, T. Mates, M. Ledinský, T. h. Stuchlíková, J. Stuchlík, A. Fejfar
    A simple quality factor for characterization of thin silicon films
    Journal of Non-Crystalline Solids 354 (2008) 2227-2230.
  43. A. Vetuško, M. Ledinský, J. Stuchlík, T. Mates, A. Fejfar, J. Kočka
    Mapping of mechanical stress in silicon thin films on silicon cantilevers by Raman microspectroscopy
    Journal of Non-Crystalline Solids 354 (2008) 2235-2237.
  44. B. Rezek, E. Šípek, M. Ledinský, P. Krejza, J. Stuchlík, A. Fejfar, J. Kočka
    Spatially localized current-induced crystallization of amorphous silicon films
    Journal of Non-Crystalline Solids 354 (2008) 2305-2309.
  45. J. Kočka, T. Mates, M. Ledinský, T. h. Stuchlíková, J. Stuchlík, A. Fejfar
    Properties of thin film silicon, prepared at high growth rate in a wide range of thicknesses
    Journal of Non-Crystalline Solids 354 (2008) 2451-2454.
  46. T. Mates, P.C.P. Bronsveld, A. Fejfar, B. Rezek, J. Kočka, J.K. Rath, R.E.I. Schropp
    Structure of mixed-phase Si films studied by C-AFM and X-TEM.
    Journal of Physics: Conference Series 61 (2007) 790-794.
  47. J. Čermák, B. Rezek, V. Cimrová, D. Výprachtický, M. Ledinský, T. Mates, A. Fejfar, J. Kočka
    Correlation of atomic force microscopy detecting local conductivity and micro-Raman spectroscopy on polymer-fullerene composite films
    Physica Status Solidi-Rapid Research Letters 1 (5) (2007) 193-195.
  48. J. Kočka, T. Mates, M. Ledinský, J. Stuchlík, A. Fejfar, K. Gunnarsson
    Controlled growth of nanocrystalline silicon on permalloy micro-patterns
    Applied Physics A-Materials Science & Processing A 88 (2007) 797-800.
  49. S. Honda, T. Mates, K. Knížek, M. Ledinský, A. Fejfar, J. Kočka, T. Yamazaki, Y.Uraoka, T.Fuyuki
    Hydrogenation of polycrystalline silicon thin films
    Thin Solid Films 501 (2006) 144-148.
  50. H.Boldyryeva, S.Honda, A.Macková, T. Mates, A. Fejfar, J. Kočka
    Characterization of hydrogen contained in passivated poly-Si and microcrystalline-Si by ERDA technique
    Surface and Interface Analysis 38, č.4 (2006) 819-822.