1. P. Klapetek, A. Fejfar, B. Rezek, J. Čermák
    Local Current Measurements, Chapter 10 in Quantitative Data Processing in Scanning Probe Microscopy, SPM Applications for Nanometrology (2nd ed.)
    Quantitative Data Processing in Scanning Probe Microscopy 2nd Edition SPM Applications for Nanometrology by Petr Klapetek
  2. A. Fejfar, B. Rezek, J. Čermák
    Local Current Measurements
    Chapter 10 in Quantitative Data Processing in Scanning Probe Microscopy (Second edition), editor. P. Klapetek, , Elsevier, 2018, ISBN 978-0-12-813347-7