1. M. Müller, M. Ledinský, J. Kočka, A. Fejfar, J. Červenka
    Effects of nanowire size and geometry on silicon nanowire array thin film solar cells
    Journal of Vacuum Science and Technology B 36 (2018) 011401(1)-011401(6).
  2. Z. Hájková, P. Bauerová, A. Fejfar, M. Šlouf
    Electron Microscope – The Key to the Secrets of the Micro- and Nanoworld
    Chemické listy 112 (2018) 128-134.
  3. P. Klapetek, A. Fejfar, B. Rezek, J. Čermák
    Local Current Measurements, Chapter 10 in Quantitative Data Processing in Scanning Probe Microscopy, SPM Applications for Nanometrology (2nd ed.)
    Quantitative Data Processing in Scanning Probe Microscopy 2nd Edition SPM Applications for Nanometrology by Petr Klapetek
  4. H. Beran, V. Cílek, A. Fejfar, E. Hulicius, L. Lízal, V. Mařík, V. Pačes, M. Punčochář, R. Šrám, J. Vondráš, V. Wagner
    Where Czech energetics will be directed?
    ISBN 978-80-7261-560-5 Albatros Media a.s., 2018
  5. J. Řáhová, K. Sampathkumar, A. Vetuško, M. Ledinský, Z. Hájková, A. Fejfar, O. Frank
    Local Photovoltaic Properties of Graphene–Silicon Heterojunctions
    physica status solidi (b) 255 (2018) 1800305(1)-1800305(6).
  6. A. Fejfar, B. Rezek, J. Čermák
    Local Current Measurements
    Chapter 10 in Quantitative Data Processing in Scanning Probe Microscopy (Second edition), editor. P. Klapetek, , Elsevier, 2018, ISBN 978-0-12-813347-7