1. J. Onoda, M. Ondráček, A, Yurtsever, P. Jelínek, Y. Sugimoto
    Initial and secondary oxidation products on the Si(111)-(7x7) surface identified by atomic force microscopy and first principles calculations
    Applied Physics Letters 104 (2014) 133107(1)-133107(4).
  2. K. Kůsová, P. Hapala, J. Valenta, P. Jelínek, O. Cibulka, L. Ondič, I. Pelant
    Direct Bandgap Silicon: Tensile-Strained Silicon Nanocrystals
    Advanced Materials Interfaces 1 (2014) 1300042(1)-1300042(9).
  3. M. Švec, P. Hapala, M. Ondráček, P. Merino, M. Blanco-Rey, P. Mutombo, M. Vondráček, Y. Polyak, J. A. Martín Gago, P. Jelínek
    Silicene versus two-dimensional ordered silicide: Atomic and electronic structure of Si-(√19×√19)R23.4◦/Pt(111)
    Physical Review B 89 (2014) 201412(1)-201412(5).
  4. M. Telychko, P. Mutombo, M. Ondráček, P. Hapala, F.C. Bocquet, J. Kolorenč, M. Vondráček, P. Jelínek, M. Švec
    Achieving High-Quality Single-Atom Nitrogen Doping of Graphene/SiC(0001) by Ion Implantation and Subsequent Thermal Stabilization
    ACS Nano 8 (2014) 7318-7324.
  5. E. J. Spadafora, J. Berger, P. Mutombo, M. Telychko, M. Švec, Z. Majzik, A. B. McLean, P. Jelínek
    Identification of Surface Defects and Subsurface Dopants in a Delta-Doped System Using Simultaneous nc-AFM/STM and DFT
    Journal of Physical Chemistry C 118 (2014) 15744-15753.
  6. P. Hapala, G. Kichin, Ch. Wagner, F. S. Tautz, R. Temirov, P. Jelínek
    Mechanism of high-resolution STM/AFM imaging with functionalized tips
    Physical Review B 90 (2014) 085421(1)-085421(9).
  7. P. Merino, M. Švec, J.I. Martinez, P. Jelínek, P. Lacovig, M. Dalmiglio, S. Lizzit, P. Soukiassian, J. Cernicharo, J.A. Martin-Gago
    Graphene etching on SiC grains as a path to interstellar polycyclic aromatic hydrocarbons formation
    Nature Communications 5 (2014) 3054(1)-3054(9).
  8. P. Hapala, R. Temirov, F. S. Tautz, P. Jelínek
    Origin of High-Resolution IETS-STM Images of Organic Molecules with Functionalized Tips
    Physical Review Letters 113 (2014) 226101(1)-226101(5).