1. O. Ranasingha, H. Wang, V. Zobač, P. Jelínek, G. Panapitiya, A. J. Neukirch∥, O. V. Prezhdo, J. P. Lewis
    Slow Relaxation of Surface Plasmon Excitations in Au55: The Key to Efficient Plasmonic Heating in Au/TiO2
    Journal of Physical Chemistry Letters 7 (2016) 1563-1569.
  2. P. Hapala, M. Švec, O. Stetsovych, N. J. van der Heijden, M. Ondráček, J. van der Lit, P. Mutombo, I. Swart, P. Jelínek
    Mapping the electrostatic force field of single molecules from high-resolution scanning probe images
    Nature Communications 7 (2016) 11560(1)-11560(8).
  3. M. Ondráček, P. Hapala, P. Jelínek
    Charge-state dynamics in electrostatic force spectroscopy
    Nanotechnology 27 (2016) 274005(1)-274005(13).
  4. V. Zobač, J.P. Lewis, P. Jelínek
    Non-adiabatic molecular dynamic simulations of opening reaction of molecular junctions
    Nanotechnology 27 (2016) 285202(1)-285202(8).
  5. K. Kůsová, P. Hapala, P. Jelínek, I. Pelant
    Band Structure of Silicon Nanocrystals
    Chapter 4 in "Silicon Nanophotonics. Basic Principles, Present Status, and Perspectives". Second Edition, ed. by L. Khriachtchev, Pan Stanford Publishing 2016, pp 109-144.
  6. N. J. van der Heijden, P. Hapala, J. A. Rombouts, J. van der Lit, D. Smith, P. Mutombo, M. Švec, P. Jelínek, I. Swart
    Characteristic Contrast in Δfmin Maps of Organic Molecules Using Atomic Force Microscopy
    ACS Nano 10 (2016) 8517-8525.
  7. J. Berger, K. Kośmider, O. Stetsovych, M. Vondráček, P. Hapala, E. J. Spadafora, M. Švec, P. Jelínek
    Study of Ferrocene Dicarboxylic Acid on Substrates of Varying Chemical Activity
    Journal of Physical Chemistry C 120 (2016) 21955-21961.
  8. J. van der Lit, F. Di Cicco, P. Hapala, P. Jelínek, I. Swart
    Submolecular Resolution Imaging of Molecules by Atomic Force Microscopy: The Influence of the Electrostatic Force
    Physical Review Letters 116 (2016) 096102-1-096102-5.
  9. J. Sforzini, P. Hapala, M. Franke, G. van Straaten, A. Stöhr, S. Link, S. Soubatch, P. Jelínek, T.-L. Lee, U. Starke, M. Švec, F. C. Bocquet, F. S. Tautz
    Structural and Electronic Properties of Nitrogen-Doped Graphene
    Physical Review Letters 116 (2016) 126805(1)-126805(6).
  10. N. Kocić, X. Liu, S. Chen, S. Decurtins, O. Krejčí, P. Jelínek, J. Repp, S.-X. Liu
    Control of Reactivity and Regioselectivity for On-Surface Dehydrogenative Aryl–Aryl Bond Formation
    Journal of the American Chemical Society 138 (2016) 5585-5593.
  11. W. Kamiski, R. Topolnicki, P.Hapala, P. Jelínek, R. Kucharczyk
    Tuning the conductance of benzene-based single-molecule junctions
    Organic Electronics 34 (2016) 254-261.
  12. H. Vázquez, P. Jelínek, M. Brandbyge, A.P. Jauho, F. Flores
    Corrections to the density-functional theory electronic spectrum: copper phthalocyanine.
    Applied Physics A-Materials Science & Processing 95 (2009) 257-263.
  13. M. Švec, V. Dudr, M. Vondráček, P. Jelínek, P. Mutombo, V. Cháb, F. Šutara, V. Matolín, K. Prince
    Intra-atomic charge re-organization at the Pb Si interface: Bonding mechanism at low cover.
    Surface Science 603 (2009) 2861-2869.
  14. P. Pou, S.A. Ghasemi, P. Jelínek, T. Lenosky, S. Goedecker, R. Perez
    Structure and stability of semiconductor tip apexes for atomic force microscopy.
    Nanotechnology 20 (2009) 264015-1-264015-10.
  15. R. Bechstein, C. González, J. Schütte, P. Jelínek, R. Pérez, A. Kühnle
    'All-inclusive' imaging of the rutile TiO.2.(110) surface using NC-AFM.
    Nanotechnology 20 (2009) 505703(1)-505703(7).
  16. K. Košmider, A. Krupski, P. Jelínek, L. Jurczyszyn
    Atomic and electronic properties of the Pb/Mo(110) adsorption system.
    Physical Review B 80 (2009) 115424(1)-115424(7).
  17. S. Sadewasser, P. Jelínek, Ch.K. Fang, O.Custance, Y. Yamada, Y.Sugimoto, M.Abe, S.Morita
    New Insights on Atomic-Resolution Frequency-Modulation Kelvin-Probe Force-Microscopy Imaging of Semiconductors.
    Physical Review Letters 103 (2009) 266103(1)-266103(4).
  18. P. Pou, P. Jelínek, R. Pérez
    Basic Mechanisms for Single Atom Manipulation in Semiconductor Systems with the FM-AFM.
    Chapter 11 in Noncontact Atomic Force Microscopy, eds. S.Morita, F.J. Giessibl, R. Wiesendanger, in series NanoScience and Technology, vol. 2, Springer-Verlag Berlin Heidelberger 2009 pp. 227-248.