1. O. Krejčí, P. Hapala, M. Ondráček, P. Jelínek
    Principles and simulations of high-resolution STM imaging with a flexible tip apex
    Physical Review B 95 (2017) 045407(1)-045407(9).
  2. J. Onoda, M. Ondráček, P. Jelínek, Y. Sugimoto
    Electronegativity determination of individual surface atoms by atomic force microscopy
    Nature Communications 8 (2017) 15155(1)-15155(6).
  3. T. Chutora, J. R. López Roso Redondo, B. De La Torre Cerdeño, M. Švec, P. Jelínek, H. Vázquez
    Stable Au–C bonds to the substrate for fullerene-based nanostructures
    Beilstein Journal of Nanotechnology 8 (2017) 1073-1079.
  4. T. Meier, R. Pawlak, Sh. Kawai, Y. Geng, X. Liu, S. Decurtins, P. Hapala, A. Baratoff, Sh.-X. Liu, P. Jelínek, E. Meyer, Th. Glatzel
    Donor–Acceptor Properties of a Single-Molecule Altered by On-Surface Complex Formation
    ACS Nano 11 (2017) 8413-8420.
  5. B. De La Torre Cerdeño, M. Švec, G. Foti, O. Krejčí, P. Hapala, A. Garcia-Lekue, T. Frederiksen, R. Zbořil, A. Arnau, H. Vázquez, P. Jelínek
    Submolecular Resolution by Variation of the Inelastic Electron Tunneling Spectroscopy Amplitude and its Relation to the AFM/STM Signal
    Physical Review Letters 119 (2017) 166001(1)-166001(6).
  6. O. Stetsovych, M. Švec, J. Vacek, J. Vacek Chocholoušová, A. Jančařík, J. Rybáček, K. Kosmider, I. G. Stará, P. Jelínek, I. Starý
    From helical to planar chirality by on-surface chemistry
    Nature Chemistry 9 (2017) 213-218.
  7. A. Charvátová Campbell, P. Jelínek, P. Klapetek
    Study of uncertainties of height measurements of monoatomic steps on Si 5x5 using DFT
    Measurement Science and Technology 28 (2017) 034005(1)- 034005(6).
  8. P. Jelínek
    High resolution SPM imaging of organic molecules with functionalized tips
    Journal of Physics: Condensed Matter 29 (2017) 343002(1)- 343002(18).
  9. M. Švec, P. Jelínek, P. Shukrynau, C. González, V. Cháb, V. Drchal
    Local atomic and electronic structure of the Pb/Si(111) mosaic phase: STM and ab initio study.
    Physical Review B 77 (2008) 125104(1)-125104(8).
  10. P. Jelínek, M. Švec, P. Pou, R. Perez, V. Cháb
    Tip-Induced Reduction of the Resonant Tunneling Current on Semiconductor Surfaces.
    Physical Review Letters 101 (2008) 176101(1)-176101(4).
  11. P. Jelínek, R. Pérez, J. Ortega, F. Flores
    Ab initio study of evolution of mechanical and transport properties of clean and contaminated Au nanowires along the deformation path.
    Physical Review B 77 (2008) 115447(1)-115447(11).
  12. B. Pieczyrak, C. González, P. Jelínek, R. Peréz, J. Ortega, F. Flores
    Mechanical and electrical properties of stretched clean and H-contaminated Pd-nanowires.
    Nanotechnology 19 (2008) 335711(1)-335711(8).
  13. Y.Sugimoto, P. Pou, O. Custance, P. Jelínek, M. Abe, R. Perez, S. Morita
    Complex Patterning by Vertical Interchange Atom Manipulation Using Atomic Force Microscopy.
    Science 322 (2008) 413-417.
  14. Y. Sugimoto, P. Pou, M. Abe, P. Jelínek, R. Pérez, S. Morita, Ó. Custance
    Chemical identification of individual surface atoms by atomic force microscopy.
    Nature 446 (2007) 64-67.
  15. Y.Sugimoto, P. Jelínek, P.Pou, M.Abe, S.Morita, R. Perez, O. Custance
    Mechanism for Room-Temperature Single-Atom Lateral Manipulations on Semiconductors using Dynamic force Microscopy.
    Physical Review Letters 98 (2007) 106104-1-106104-4.
  16. M.A. Basasnta, Y.J. Dappe, P. Jelínek, J. Ortega
    Optimized atomic-like orbitals fo first-principles tight-binding molecular dynamics.
    Computational Materials Science 39 (2007) 759-766.
  17. N.Oyabu, P.Pou, Y.Sugimoto, P. Jelínek, M.Abe, S.Morita, R.Pérez, Ó.Custance
    Single atomic contact adhesion and dissipation in dynamic force microscopy
    Physical Review Letters 96 č.10 (2006) 106101/1-106101/4.
  18. P. Jelínek, R.Pérez, J.Ortega, F.Flores
    Hydrogen dissociation over Au nanowires and the fractional conductance quantum
    Physical Review Letters 96, č.4 (2006) 046803/1-046803/4.
  19. Y.Sugimoto, P.Pou, O.Custance, P. Jelínek, S.Morita, R.Peréz, M.Abe.
    Real topography, atomic relaxations and short-range chemical interactions in atomic force microscopy: The case of the α-Sn/Si(111)-(√3 x √3) R30o surface.
    Physical Review B 73 (2006) 205329-1-205329-9.