Transmission electron microscope Jeol JEM-1200EX

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Transmisní elektronový mikroskop Jeol JEM-1200EX
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Transmission electron microscope Jeol JEM-1200EX allows for characterization of samples using conventional electron microscopy methods (bright/dark field imaging and electron diffraction) as well as conducting in-situ experiments (sample toughness under strain, dynamical observation of dislocations) at room and elevated (up to 300°C)  temperature.