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Transmission electron microscope FEI Tecnai TF20 X-Twin with field emission gun (FEG) enables comprehensive characterization of materials at nanoscale combining information on sample morphology (BF / DF imaging), chemical composition (EDS, EELS, EFTEM) and atomic structure (electron diffraction). Direct observation of atomic structure and its defects with resolution of 0.19 nm is available (HRTEM). Microscope can be also operated in scanning mode (STEM - HAADF) e.g. for observation of heavy element nanoparticles in matrix. Attachment ASTAR allows for phase, crystallographic orientation and strain mapping at nanoscale. Lorentz lens provides visualization of domains and their orientation in magnetic materials.