Image Regime contract access Category Characterisation and testing > Scanning probe microscopy Inclusion to structure Scientific Laser Applications Contact person prof. Alexander V. Bulgakov, DrSc. Manufacturer https://www.tescan.com/product-portfolio/sem/ Text Image Scanning electron microscope: 50eV (BDT) - 30keV; 2pA - 200nA; SE / BSE, in-beam SE / BSE, STEM and Ultim Extreme and Ultim Max EDS detectors; 5-axis stage;