Atomic force microscope NTEGRA Prima


Atomic force microscope NTEGRA Prima is capable, in addition to common topography imaging, collect microscopic information in a set of advanced modes: Kelvin probe force microscopy, conductive AFM, AFM in liquids, electrochemical AFM, or scanning tunneling microscopy. The detection system uses an infrared laser diode (wavelength 1100 nm) to minimize artificial effect when performing optical or opto-electronic experiments. For those experiments an optical fiber is mounted near the place of measurements, so that any controlled light source (diode, lase, solar simulator) can be attached.