Research Areas and Topics
Discover the research topics currently explored by our research teams.
| Topic name | Author | Department |
|---|---|---|
| The silicon thin films thickness imaging using photoluminescence spectroscopy | RNDr. Martin Ledinský, Ph.D. | Department of Thin Films and Nanostructures (26), Raman spectroscopy laboratory (2610), Thin Films (2611), AFM Laboratory (2603) |