Publications

In the list of publications, you will find the complete output of our researchers since 1961.

  1. H. Beran, V. Cílek, A. Fejfar, E. Hulicius, L. Lízal, V. Mařík, V. Pačes, M. Punčochář, R. Šrám, J. Vondráš, V. Wagner
    Where Czech energetics will be directed?
    ISBN 978-80-7261-560-5 Albatros Media a.s., 2018
  2. B. Honerlage, I. Pelant
    Symmetry and Symmetry-Breaking in Semiconductors. Fine Structure of Exciton States
    Springer Tract in Modern Physisc 279, Springer International Publishing AG, 2018
  3. D. Savchenko, A. Kassiba
    Frontiers in Magnetic Resonance (Volume 1): Electron Paramagnetic Resonance in Modern Carbon-Based Nanomaterials, Bentham Science Publishers 2018, pp 1 - 288 ISBN: 978-1-68108-694-1
  4. CPSEM2018: Structural and ferroelectric phase transitions
    Eds. J. Hlinka, J. Pokorný, A. Bubnov; Prague; (2018) pp. 1-140; ISBN: 978-80-905962-7-6
  5. J. Drahokoupil, M. Čerňanský, N. Ganev, K. Kolařík, Z. Pala
    Microstress and x-ray diffraction
    (2008) -.
  6. Z.Kyselovský, A. Čejchan
    Jak slunce mění den a čas, mění nás
    1. vyd. HAPPY-FOTO Česko, s.r.o. 2008
  7. P. Lipavský, J. Koláček, K. Morawetz, E. H. Brandt, T. J. Yang
    Bernoulli Potential in Superconductors
    Bernoulli Potential in Superconductors How the Electrostatic Field Helps to Understand Superconductivity Springer, Lecture Notes in Physics , Vol. 733
  8. B. Hlaváček, J. J. Mareš
    Physics of amorphous and crystalline materials
    Univerzita Pardubice, Grantová agentura AVČR, Pardubice 2008,ISBN 978-80-7395-023-1, pp. 1-347
  9. A. Fejfar, T. Šikola
    International Summer School Role of Physics in Future Applications: From Nanotechnology to Macroelectronics.
    Thin Silicon Newsletter, publ. by aSiNet thematic network newsletter within EC growth programme, editor: J. Andreu, No.3 (2002), 1  ISSN 1579-4555 ., 2002, pp. 1  ISSN 1579-4555
  10. Dynamical electron correlations in metals TB-LMTO and multiband Hubbard Hamiltonian in ELECTRON CORRELATIONS and MATERIALS PROPERTIES
    Edited by Gonis et al. Kluwer Academic/Plenum Publishers, 1999, pp.273-284