Publications

In the list of publications, you will find the complete output of our researchers since 1961.

  1. I. Pelant, J. Valenta
    Luminescence Spectroscopy II. Nanostructures, electroluminescence, stimulated emission.
    Kniha, Academia Praha 2010,348 s., ISBN 978-80-200-1846-5
  2. The ILD concept group, z FZÚ, J. Cvach, P. Gallus, M.Havránek, M. Janata, M. Marčišovský, I. Polák, J. Popule, L. Tomášek, M. Tomášek, P.Růžička, P. Šícho, J. Smolík, V. Vrba, J. Zálešák
    The International Large Detector: Letter of Intent.
    arXiv:1006.3396
  3. P. Lejček
    Grain boundary segregation in metals
    Grain boundary segregation in metals
  4. A. Fejfar, T. Šikola
    International Summer School Role of Physics in Future Applications: From Nanotechnology to Macroelectronics.
    Thin Silicon Newsletter, publ. by aSiNet thematic network newsletter within EC growth programme, editor: J. Andreu, No.3 (2002), 1  ISSN 1579-4555 ., 2002, pp. 1  ISSN 1579-4555
  5. M. Kotrla, J. Krug, P. Šmilauer
    Effects of adsorbates on submonolayer growth
    Collective Diffusion on Surfaces: Correlation Effects and Adatom Interactions, Eds. M.C. Tringides and Z. Chvoj, Kluwer Academic Publisher, 2001, pp. 247-257. ISBN: 978-0-7923-7115-1, 978-0-7923-7116-8.
  6. J. Slezák, P. Schukrinov, A. Savchenkov, P. Mutombo, V. Cháb
    Experimental Aspects of Metal Particle Diffusion on a Silicon Surface.
    in: M.C.Tringides, Z.Chvoj eds.: Collective Diffusion on Surfaces:Collective Behaviour and the Role of Adatom Interaction. Kluwer, Dordrecht 2001, 11-22., 2001, pp.
  7. G. Juška, N. Nekrašas, J. Stuchlík, K. Arlauskas, M. Viliunas, J. Kočka
    Features of Charge Carrier Transport in uc-Si:H/a-Si:H Superlattices.
    in: Ultrafast Phenomena in Semiconductors, Materials Science Forum, Trans. Tech. Publ. 2001, p. 301-304, 2001, pp.
  8. V. Drchal, V. Janiš, J. Kudrnovský
    Dynamical electron correlations in metals TB-LMTO and multiband Hubbard Hamiltonian in ELECTRON CORRELATIONS and MATERIALS PROPERTIES
    Edited by Gonis et al. Kluwer Academic/Plenum Publishers, 1999, pp.273-284