Experimental and theoretical analysis of defects on metallic oxide and semiconductor surfaces

Investigator
  • Ing. Vladimír Cháb, CSc.
Provider and programme
GA AVČR » Standardní
Commencement date
1/1/2009
Completion date
12/31/2012
Registration number
IAA100100905

AFM, STM, interaction of the tip with the surface, the relationship between forces and tunneling current, the influence of defects on the local density of states, sensors, heterogeneous catalysis, cluster carriers