Assembling and characterization at atomic scale using atomic force microscopy (ATOMAN09)


Aim of this project is to design new approaches to assemble and characterize complex nanostructures on semiconductor surfaces by scanning probe microscopies. Heterogeneous atomic clusters will be created with the controlled atomic manipulation. The relation between the tunneling current and the chemical bond will be studied on the atomic scale. In this project, we plan to develop new experimental and theoretical techniques of the scanning probe microscopy. The combination both experimental and theoretical tools will open the full understanding of underlaying physical and chemical processes.