Atomic Force Microscope combined with Raman spectrometer, Horiba

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The Xplora Plus (HORIBA) is a reliable and high-performance microRaman system combined with an atomic force microscope designed for both scientific and industrial purposes. It represents a precise, high resolution and sensitive instrument for chemical, structural and morphological analysis. Raman scattering measurements can be provided using three laser sources (532, 638, and 785 nm), four gratings (600, 1200, 1800 and 2400 grooves/mm) and various objectives (10, 20, 50 and 100×) offering the spectral resolution < 1.4 cm–1 and maximum possible lateral resolution of 500 nm.