Within the project, we will create a platform developing advanced methods of structure analysis, which will however have - compared with the original ASTRA project - direct application outcomes in the area of research of thin layers. ASTRANIT will focus on the methodology and experiment in the following areas: structure, phase and morphological analysis of thin films, chemical crystallography, structure analysis of pharmaceuticals, research of aperiodic structures, structure analysis of nanocrystals from the electron diffraction, mineralogical crystallography, OD (order-disorder) structure, development of methodologies for powder diffraction. Nitride layers will be developed, reviewed and modified in direct linkage to the outputs of the structure analysis. The direct link to specific materials will be a factor that will significantly accelerate and streamline further development of methodologies of analysis of thin films. The ASTRANIT project will create the necessary conditions for maintaining world-class structure analysis at the Institute of Physics (IoP), which was built by systematically lifelong efforts of key figures in the ASTRA project. At the same time the project will make application significant nitride semiconductors accessible for the Czech industry and scientific laboratories. It has been managed within the OPPC projects to unify the methodological and experimental capabilities of the teams and in case that these projects will continue to be supported under the ASTRANIT project, an increase of the number of both the scientific publications in prestigious impacted journals and the results applicable in the industry will occur in the coming years. Thanks to the synergy of the original projects, the costly investments will be utilized more effectively and efficiently.
Centre of Technology and Advanced Structure Analysis of Materials with Application Impact (ASTRA)
Abstract