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Electron Probe MicroAnalyzer JXA-8230 of JEOL is equipped with five wavelength dispersive (WD) and two energy dispersive (ED) X-ray spectrometers. Detectors of secondary and backscattered electrons are also integrated.
This instrument enables fast qualitative analysis as well as an accurate and precise quantitative analysis of chemical elements with a detection limit of the order 100 ppm in solid samples. Imaging of the surface topography with lateral resolution up to 5 nm is also possible.
Reservation phone no.: 220318402, 220318591