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A combined theoretical and experimental work published in Physical Review Letters shows that x ray magnetic circular dichroism (XMCD) is present in semiconducting MnTe. Together with another related effect (linear dichroism, XMLD) it can be exploited to visualise magnetic domains. If a MnTe-related material (or some other altermagnet) is chosen for industrial production of memory devices, photoemission microscopy based on XMCD together with XMLD at suitable energy of x-ray photons can be used to monitor their domain structure during fabrication process. You can find more details about XMCD in MnTe in the news.