Abstract
The main goal of the project is widening of products in electron microscopy field by technologicaly new detection units based on semiconductor devices and development of unique scintilation materials, which will find their application in electron detector units as well as in fast detectors of other particles or ionizing radiation. Results of the project will keep or increase competitivness of ČR in the key industry of electron microscopy and will help to built and widen the portfolio of products for other markets. New characterization methods of above mentioned detectors will be also developed to inspect effectively their parameters during production.