1. M. Ondráček, P. Hapala, M. Švec, P. Jelínek
    Imaging Charge Distribution Within Molecules by Scanning Probe Microscopy
    Chapter 16 in Kelvin Probe Force Microscopy, eds. S. Sadewasser & T. Glatzel, Springer Series in Surface Sciences, vol. 65, Springer, Cham, 2018, pp. 499-518
  2. K. Kůsová, P. Hapala, P. Jelínek, I. Pelant
    Band Structure of Silicon Nanocrystals
    Chapter 4 in "Silicon Nanophotonics. Basic Principles, Present Status, and Perspectives". Second Edition, ed. by L. Khriachtchev, Pan Stanford Publishing 2016, pp 109-144.
  3. P. Hapala, M. Ondráček, O. Stetsovych, M. Švec, P. Jelínek
    Simultaneous nc-AFM/STM Measurements with Atomic Resolution
    Noncontact Atomic Force Microscopy vol. 3
  4. P. Jelínek
    Theoretical challenges of simultaneous nc-AFM/STM experiments
    Imaging and Manipulation of Adsorbates Using Dynamic Force Microscopy page 81-92 year 2015 ISBN 978-3-319-17400-6 Part of the series Advances in Atom and Single Molecule Machines