We offer comprehensive characterization of inorganic materials at micro/nano scale using scanning (SEM) and transmission (TEM) electron microscopy.
We offer the following types of analysis:
Scanning electron microscopy (SEM)
- morphological analysis and surface imaging - example
- chemical composition analysis (EDX) - example
- phase analysis (EDX/EBSD) - example
- crystallographic orientation analysis (EBSD) - example
- nanoindentation - example
- ion beam machining (FIB) - example
- detection of electron beam induced current (EBIC) - example
- in-situ microscopy (heating, tension/compression/bending deformation) - example
Transmission electron microscopy (TEM)
- morphological analysis and imaging (BF/DF) - example
- chemical composition analysis (EDX) - example
- chemical composition analysis (EELS) - example
- phase analysis (ED/EDX/EELS) - example
- scanning TEM (STEM/HAADF) - example
- crystallographic orientation (ACOM) - example
- strain analysis (ACOM) - example
- atomic resolution imaging (HRTEM) - example
- imaging of magnetic domains (LTEM) - example
- in-situ microscopy (heating, tensile deformation) - example