Laboratory of electron microscopy (LEM) focuses on complex characterization of inorganic materials at micro/nanoscale. LEM operates transmission and scanning electron microscopes with a wide range of analytical techniques as well as instruments for advanced sample preparation. Therefore, it is possible to examine both powder and bulk samples including thin layers. LEM focuses mainly on the study of metals and alloys, semiconductors, superconductors, oxide materials and minerals, but it can analyze almost any inorganic material.
In LEM, the following techniques are available: phase analysis (combination of chemical composition and crystal structure), morphological analysis of the phases, analysis of crystallographic orientation of grains, imaging of structures with atomic resolution and defects in the structure, or imaging of magnetic domains and their mutual orientation. Using in-situ microscopy, it is possible to observe microstructure changes during sample heating, creation of deformations upon mechanical strain or measure mechanical properties with nanoindentation.
Analysis offered by the laboratory:
- Morphological analysis (SEM, TEM),
- Phase analysis/analysis of crystallographic orientation (SEM/EBSD, TEM/ACOM),
- Testing of mechanical properties (SEM-nanoindentation),
- Phase anlysis and mophology imaging of individual phases (TEM/EDX/ED/EELS),
- Imaging of structures with atomic resolution and defects in the structure (HRTEM),
- Imaging of magnetic domains and their mutual orientation (lorentzovská TEM),
- in-situ microscopy (heating, strain-stress deformation).