Diffractometer is equipped by two exchangeable microfocal X-ray tubes with copper and molybdenum anodes including bidirectional collimation optics. The primary beam profile can be formed be slits ranging from 0.1 to 1.5 mm, area detector distance from the sample can be varied from 50 mm to 1.6 m, which allows for adjustment of resolution and measurement from small angle scattering up to diffraction angles of 70 degrees. Apart from transmission geometry, the device is capable of grazing incidence scattering (GISAXS) from flat samples to characterise surface nanostructures. It is equipped by tensile stage up to 600 N and non-ambient temperature accessories allowing for temperatures from -150 to +350 degrees Centigrade including possible simultaneous tensile loading. In transmission geometry, high temperatures up to 550 degrees Centigrade can be utilised.