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The paper proposes a fully optical method for determination of a cubic crystal grain orientation in a sample inspected by a Raman microscope. The method is based on a universal and strong polarisation anisotropy of the Raman scattering by doubly degenerate optic phonon modes. The feasibility of the approach is demonstrated by comparing grain orientations in a polycrystalline cubic lacunar spinel GaV4S8 determined independently using electron backscatter diffraction and Raman scattering methods.
Contact person: Jiří Hlinka
Description
Grain morphology of the investigated GaV4S8 ceramics.
(a) Scanning electron microscope image of an area of interest with sample coordinate system as an inset;
(b) Inverse pole figure map from EBSD analysis of the area in (a);
(c) positions of four grains chosen for detailed Raman measurements, indicated projections of elementary cubic cells clarify their crystallographic orientation;
(d) unit triangle with the colour code of the inverse pole figure map;
(e) surface normals of the chosen grains;
(f) Parallel-polarised Raman scattering intensity ratios detected from the four grains, which allows determination of their crystallographic orientation independent of the EBSD analysis. Data shows intensity ratio at selected frequencies as a function of the angle ϕ between the polariser and the reference direction on the sample surface.
(a) Scanning electron microscope image of an area of interest with sample coordinate system as an inset;
(b) Inverse pole figure map from EBSD analysis of the area in (a);
(c) positions of four grains chosen for detailed Raman measurements, indicated projections of elementary cubic cells clarify their crystallographic orientation;
(d) unit triangle with the colour code of the inverse pole figure map;
(e) surface normals of the chosen grains;
(f) Parallel-polarised Raman scattering intensity ratios detected from the four grains, which allows determination of their crystallographic orientation independent of the EBSD analysis. Data shows intensity ratio at selected frequencies as a function of the angle ϕ between the polariser and the reference direction on the sample surface.