Atomic force microscope Asylum Research Cypher S

AFM Asylum Research Cypher S
Regime
closed
Category
Characterisation and testing > Scanning probe microscopy
Inclusion to structure
Department of Dielectrics
Contact person

AFM microscope Asylum Research Cypher S allows performing measurements with very high spatial resolution at ambient conditions. It includes several operating modes such as Contact mode, Tapping mode (AC mode), Piezoresponse Force Microscopy (PFM), Switching spectroscopy PFM, Vector PFM, Dual AC Resonance Tracking (DART) PFM, Kelvin Probe Force Microscopy (KPFM), Conductive AFM (CAFM), etc.
 

AFM Asylum Research Cypher S 

Atomic force microscope Asylum Research Cypher S.