Profile

High-resolution X-ray diffraction, X-ray reflectometry, anomalous X-ray scattering, experimental investigation of structural properties of layers, their systems and interfaces. Relationship between structural properties of systems and technology of their growth.


Preparation and coordination of the MEYS INGO and INTER-EXCELLENCE projects " Membership of the Czech Republic in the European Synchrotron Radiation Facility".

ORCID 0000-0002-1629-0183
ResearcherID H-2444-2014
Scopus Author ID 6506221812