1. M. Tavakkoly, J. Chalupský, V. Hájková, W. Hillert, Š. Jelínek, L. Juha, M. Makita, T. Mazza, M. Meyer, J. Montano, H. Sinn, V. Vozda, M. Vannoni
    Investigating the damage threshold of X-ray mirror C-coated/Si-substrate) at grazing incidence and determining electron collision length at 1keV at the European XFEL
    Proceedings of SPIE 13533 (2025) 1353303-1-1353303-5.
  2. S. S. Makarov, V. V. Zhakhovsky, S. Yu. Grigoryev, P. Chuprov, T. A. Pikuz, N. A. Inogamov, V. A. Khokhlov, Y. V. Petrov, E. A. Perov, V. Shepelev, T. Shobu, A. Tominaga, L. Rapp, S. Juodkazis, M. Makita, Mo. Nakatsutsumi, T. R. Preston, K. Appel, Z. Konopkova, V. Cerantola, E. Brambrink, J.-P. Schwinkendorf, I. Mohacsi, V. Vozda, V. Hájková, T. Burian, J. Chalupský, L. Juha, N. Ozaki, R. Kodama, U. Zastrau, A. V. Rode, S. A. Pikuz
    Formation of high-aspect-ratio nanocavity in LiF crystal using a femtosecond X-ray freeelectron laser pulse
    Nature Communications 16 (2025) 11504-1-11504-13.
  3. M. Šmíd, P. Khademi, N. Ahmadiniaz, M. Andrzejewski, C. Baehtz, E. Brambrink, J. Bulička, T. Burian, S. Di Dio Cafiso, J. Chalupský, T. E. Cowan, S. Göde, J. Grenzer, V. Hájková, P. Hilz, W. Hippler, H. Höppner, A. Horynová, L. Huang, O. Humphries, Š. Jelínek, L. Juha, F. Karbstein, Ch. Kohlfürst, A. L. Garcia, R. Lötzsch, M. Masruri, A. Matheron, M. Nakatsutsumi, G. G. Paulus, A. Pelka, T. R. Preston, S. V. Rahul, L. Randolph, A. Sävert, H.-P. Schlenvoigt, R. Schützhold, J. P. Schwinkendorf, T. Stöhlker, M. Toncian, T. Toncian, M. Valialshchikov, V. Vozda, E. Weckert, C. Wessel, J. Wild, U. Zastrau, M. Zepf
    Proof-of-principle experiment for the dark-field detection concept for measuring vacuum birefringence
    Physical Review A 112 (2025) 063512-1-063512-10.
  4. J. Krása, T. Burian, V. Hájková, J. Chalupský, Š. Jelínek, K. Frantálová, M. Krupka, Z. Kuglerová, S.K. Singh, V. Vozda, L. Vyšín, M. Šmíd, P. Perez-Martin, M. Kühlman, J. Pintor, J. Cikhardt, M. Dreimann, D. Eckermann, F. Rosenthal, S.M. Vinko, A. Forte, T. Gawne, T. Campbell, S. Ren, Y.F. Shi, T. Hutchinson, O. Humphries, T. Preston, M. Makita, M. Nakatsutsumi, X. Pan, A. Köhler, M. Harmand, S. Toleikis, K. Falk, L. Juha
    Ion emission from warm dense matter produced by irradiation with a soft x-ray free-electron laser
    Matter and Radiation at Extremes 9 (2024) , 016602(1)-016602(14).
  5. B. Keitel, J. Chalupský, Š. Jelínek, T. Burian, S. Dziarzhytski, V. Hájková, L. Juha, Z. Kuglerová, M. Kuhlmann, K. Mann, M. Ruiz-Lopez, B. Schafer, V. Vozda, T. Wodzinski, M. V. Yurkov, E. Plonjes
    Comparison of wavefront sensing and ablation imprinting for FEL focus diagnostics at FLASH2
    Optics Express 32, No. 12 (2024) 21532-215552.
  6. M. Tavakkoly, J. Chalupský, V. Hájková, W. Hillert, Š. Jelínek, L. Juha, M. Makita, T. Mazza, M. Meyer, J. Montano, H. Sinn, V. Vozda, M. Vannonia
    Comparing single-shot damage thresholds of boron carbide and silicon at the European XFEL
    Journal of Synchrotron Radiation 31 (2024) 1067-1070.
  7. J. Krása, V. Nassisi, T. Burian, V. Hájková, J. Chalupský, Š. Jelínek, K. Frantálová, M. Krupka, Z. Kuglerová, S.K. Singh, V. Vozda, L. Vyšín, J. Wilde, M. Šmíd, P. Perez-Martin, X. Pan, M. Kühlman, J. Pintor, J. Cikhardt, M. Dreimann, D. Eckermann, F. Rosenthal, S.M. Vinko, A. Forte, T. Gawne, T. Campbell, S. Ren, Y.F. Shi, T. Hutchinson, O. Humphries, T. Preston, M. Makita, M. Nakatsutsumi, A. Köhler, M. Harmand, S. Toleikis, K. Falk, L. Juha
    Ion emission from plasmas produced by femtosecond pulses of short-wavelength free-electron laser radiation focused on massive targets: an overview and comparison with long-wavelength laser ablation
    Proc. of SPIE, Vol. 12578, SPIE Optics + Optoelectronics, 2023, Prague, CR, Optics Damage and Materials Processing by EUV/X-ray Radiation (XDam8), (6 June 2023), 125780J(1) - 125780J(9)
  8. J. Chalupský, V. Vozda, J. Hering, J. Kybic, T. Burian, S. Dziarzhytski, K. Frantálová, V. Hájková, Š. Jelínek, L. Juha, B. Keitel, Z. Kuglerová, M. Kuhlmann, B. Petryshak, M. Ruitz-Lopez, L. Vyšín, T. Wodzinski, E. Plonjes
    Deep learning for laser beam imprinting
    Optics Express 31, No.12 (2023) 19703-19721.
  9. S. Makarov, S. Grigoryev, N. Inogamov, E. Filippov, T. Pikuz, N. Ozaki, M. Ishino, M. Nishikino, T.-H. Dinh, T. Kawashi, M. Zanaveskin, M. Makita, M. Nakatsutsumi, T. R. Preston, K. Appel, Z. Konopková, V. Cerantola, E. Brambrink, J.-P. Schinkendorf, I. Mohacsi, V. Vozda, V. Hájková, T. Burian, J. Chalupský, L. Juha, V. Zhakhovsky, U. Zastrau, S. Pikuz
    Damage threshold of LiF crystal irradiated by femtosecond hard XFEL pulse sequence
    Optics Express 31, No 16 (2023) 1-15.
  10. S. Makarov, M. Makita, M. Nakatsutsumi, T. Pikuz, N. Ozaki, T.R. Preston, K. Appel, Z. Konopková, V. Cerantola, E. Brambrink, J.-P. Schwinkendorf, I. Mohacsi, T. Burian, J. Chalupský, V. Hájková, L. Juha, V. Vozda, B. Nagler, U. Zastrau, S. Pikuz
    Direct LiF imaging diagnostics on refractive X-ray focusing at the EuXFEL High Energy Density instrument
    Journal of Synchrotron Radiation 30 (2023) 1-9.
  11. G. Mercurio, J. Chalupský, I.-T. Nistea, M. Schneider, V. Hájková, N. Gerasimova, R. Carley, M. Cascella, L. Le Guyader, L. Mercadier, J. Schlappa, K. Setoodehnia, M. Teichmann, A. Yaroslavtsev, T. Burian, V. Vozda, L. Vyšín, J. Wild, D. Hickin, A. Sitlenzi, M. Stupar, J. T. Delitz, C. Broers, A. Reich, B. Pfau, S. Eisebitt, D. La Civita, H. Sinn, M. Vannoni, S. G. Alcock, L. Juha, A. Scherz
    Real-time spatial characterization of micrometer-sized X-ray free-electron laser beams focused by bendable mirrors
    Optics Express 30, No12 (2022) 20980-20998.
  12. V. Vozda, N. Medvedev, J. Chalupský, J. Čechal, T. Burian, V. Hájková, L. Juha, M. Krůs, J. Kunc
    Detachment of epitaxial graphene from SiC substrate by XUV laser radiation
    Carbon 161 (2020) 36-43.
  13. V. Vozda, T. Burian, V. Hájková, L. Juha, H. Enkisch, B. Faatz, M. Hermann, I. Jacyna, M. Jurek, B. Keitel, D. Klinger, R. Loch, E. Louis, I. A. Makhotkin, E. Plönjes, K. Saksl, F. Siewert, R. Sobierajski, S. Strobel, K. Tiedtke, S. Toleikis, G. de Vries, Z. Zelinger, J. Chalupský
    Characterization of megahertz X-ray laser beams by multishot desorption imprints in PMMA
    Optics Express 28, No18 (2020) 25664-25681.
  14. G. Pérez-Callejo, S. M. Vinko, S. Ren, R. Royle, O. Humphries, T. R. Preston, B. A. Hammel, H.-K. Chung, T. Burian, V. Vozda, M.-F. Lin, T. B. van Driel, J. S. Wark
    X-ray Spectroscopic Studies of a Solid-Density Germanium Plasma Created by a Free Electron Laser
    Applied Sciences 10(22) (2020) 8153-1-8153-13.
  15. S. M. Vinko, V. Vozda, J. Andreasson, S.Bajt, J. Bielecki, T. Burian, J. Chalupský, O. Ciricosta, M. P. Desjarlais, H. Fleckenstein, J. Hajdu, V. Hájková, P. Hollebon, L. Juha, M. F. Kasim, E. E. McBride, K. Muehlig, T. R. Preston, D. S. Rackstraw, S. Roling, S. Toleikis, J. S. Wark, H. Zacharias
    Time-Resolved XUV Opacity Measurements of Warm Dense Aluminum
    Physical Review Letters 124 (2020) 225002 (1)-225002 (6).
  16. I. Milov, I. A. Makhotkin, R. Sobierajski, N. Medvedev, V. Lipp, J. Chalupský, J. M. Sturm, K. Tiedtke, G. de Vries, M. Stoermer, F. Siewert, R. van de Kruijs, E. Louis, I. Jacyna, M. Jurek, L. Juha, V. Hájková, V. Vozda, T. Burian, K. Saksl, B. Faatz, B. Keitel, E. Ploenjes, S. Schreiber, S. Toleikis, R. Loch, M. Hermann, S. Strobel, H.-K. Nienhuys, G. Gwalt, T. Mey, H. Enkisch, F. Bijkerk
    Mechanism of single-shot damage of Ru thin films irradiated by femtosecond extreme UV free-electron laser
    Optics Express 26, No.15 (2018) 19665-19685.
  17. I.A. Makhotkin, I. Milov, J. Chalupský, K. Tiedtke, H. Enkisch, G. de Vries, F. Scholze, F. Siewert, J.M. Sturm, K.V. Nikolaev, R.W.E. van de Kruijs, M.A. Smithers, H.A.G.M. van Wolferen, E.G. Keim, E. Louis, I. Jacyna, M. Jurek, D. Klinger, J.B. Pelka, L. Juha, V. Hájková, V. Vozda, T. Burian, K. Saksl, B. Faatz, B. Keitel, E. Plonjes, S. Schreiber, S. Toleikis, R. Loch, M. Hermann, S. Strobel, R. Donker, T. Mey, R. Sobierajski
    Damage accumulation in thin ruthenium films induced by repetitive exposure to femtosecond XUV pulses below the single-shot ablation threshold
    Journal of the Optical Society of America B-Optical Physics 35, No 11 (2018) 2799-2805.
  18. I. A. Makhotkin, R. Sobierajski, J. Chalupský, K. Tiedtke, G. de Vries, M. Störmer, F. Scholze, F. Siewert, R. W. E. van de Kruijs, I. Milov, E. Louis, I. Jacyna, M. Jurek, D. Klinger, L. Nittler, Y. Syryanyy, L. Juha, V. Hájková, V. Vozda, T. Burian, K. Saksl, B. Faatz, B. Keitel, E. Plönjes, S. Schreiber, S. Toleikis, R. Loch, M. Hermann, S. Strobel, H.-K. Nienhuys, G. Gwalt, T. Mey, H. Enkisch
    Experimental study of EUV mirror radiation damage resistance under long-term free-electron laser exposures below the single-shot damage threshold
    Journal of Synchrotron Radiation 25 (2018) 77-84.
  19. Q. Y. van den Berg, E. V. Fernandez-Tello, T. Burian, J. Chalupský, H.-K Chung, O. Ciricosta, G. L. Dakovski, V. Hájková, P. Hollebon, L. Juha, J. Krzywinski, R.W. Lee, M. P. Minitti, T. R. Preston, A. G. de la Varga, V. Vozda, U. Zastrau, J. S. Wark, P. Velarde, S. M. Vinko
    Clocking femtosecond collisional dynamics via resonant x-ray spectroscopy
    Physical Review Letters 120 (2018) 055002(1)-055002(6).
  20. V. Vozda, T. Burian, J. Chalupský, V. Dědič, V. Hájkova, P. Hlídek, L. Juha, M. Kozlová, M. Krůs, J. Kunc, M. Rejhon, L. Vyšín, J.J. Rocca, J. Franc
    Micro-Raman mapping of surface changes induced by XUV laser radiation in cadmium telluride
    Journal of Alloys and Compounds 763 (2018) 662-669.
  21. T.R.Preston, S.M.Vinko, O.Ciricosta, P.Hollebon, H.-K.Chung, G.L.Dakovski, J.Křivinski, M.Minitti, T. Burian, J. Chalupský, V. Hájková, L. Juha, V. Vozda, U.Zastrau, R.W.Lee, J.S.Wark
    Measurements of the K-Shell Opacity of a Solid-Density Magnesium Plasma Heated by an X-Ray Free-Electron Laser
    Physical Review Letters 119 (2017) 085001(1)-085001(5).
  22. R. Sobierajski, I. Jacyna, P. Dłużewski, M. T. Klepka, D. Klinger, J. B. Pełka, T. Burian, V. Hájková, L. Juha, K. Saksl, V. Vozda, I. Makhotkin, E. Louis, B. Faatz, K. Tiedtke, S. Toleikis, H. Enkisch, M. Hermann, S. Strobel, R. A. Loch, J. Chalupský
    Role of heat accumulation in the multi-shot damage of silicon irradiated with femtosecond XUV pulses at a 1 MHz repetition rate
    Optics Express 24 (2016) 15468-15477.