RNDr. Tereza Košutová, Ph.D.
Category
Professional staff member with higher education
Division (no.)
Department (no.)
Laboratory / Scientific group
Profile
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- Measurement of X-ray diffraction (XRD) and reflection (XRR) on nitride layers and heterostructures
- Simulation of measured results and theit evaluation: composition and thickness of layers, strain relaxation, estimation of dislocation density for different types of dilocations in GaN layers.