1. Z. Šourek, M. Kopecký, J. Fábry, J. Kub, A. Lausi, E. Busetto
    Multi-energy anomalous diffuse scattering
    Acta Crystallographica Section A 65 (2009) s216-s216.
  2. J. Zemek, J. Houdková, P. Jiříček, A. Jablonski, V. Jurka, J. Kub
    Determination of electron inelastic mean free paths for poly[methyl(phenyl)silylene] films
    Polymer 50 (2009) 2445-2450.
  3. M. Kopecký, E. Busetto, A. Lausi, Z. Šourek, J. Kub, M. Cukr, V. Novák, K. Olejník, J. P. Wright
    Imaging of interstitial atoms in Ga1-xMnxAs layers by means of X-ray diffuse scattering
    Journal of Applied Crystallography 41 (2008) 544-547.
  4. Z. Šourek, M. Kopecký, J. Kub, E. Busetto, A. Lausi, M. Cukr, V. Novák, K. Olejník
    Location of Mn sites in GaMnAs thin films studied by means of X-ray diffuse scattering
    Acta Crystallographica Section A 64 (2008) C555-C555.
  5. M. Kopecký, J. Fábry, J. Kub, A. Lausi, E. Busetto
    Multienergy Anomalous Diffuse Scattering
    Physical Review Letters 100 (2008) 195504(1)-195504(4).
  6. M. Kopecký, J. Kub, E. Busetto, A. Lausi, J. Fábry, Z. Šourek
    Anomalous scattering and isomorphous replacement in X-ray diffuse scattering holography
    physica status solidi (a) 204 (2007) 2572-2577.