1. M. Kopecký, J. Kub, J. Fábry, J. Hlinka
    Nanometer-range atomic order directly recovered from resonant diffuse scattering
    Physical Review B 93 (2016) 054202-1-054202-8.
  2. M. Kopecký, J. Fábry, J. Kub
    Modelling of cation displacements in SrTiO3 by means of multi-energy anomalous X-ray diffuse scattering
    Journal of Applied Crystallography 49 (2016) 1016-1020.
  3. M. Kopecký, J. Fábry, J. Kub
    X-ray diffuse scattering in SrTiO3 and model of atomic displacements
    Journal of Applied Crystallography 45 (2012) 393-397.
  4. Z. Šourek, M. Kopecký, J. Kub, J. Fábry, V. Novák, M. Cukr
    Real-structure anisotropy in GaMnAs layers
    Acta Crystallographica Section A 67 (2011) C442-C442.
  5. M. Kopecký, J. Kub, F. Máca, J. Mašek, O. Pacherová, A. W. Rushforth, B. L. Gallagher, R. P. Campion, V. Novák, T. Jungwirth
    Detection of stacking faults breaking the [110]/[1-10] symmetry in ferromagnetic semiconductors (Ga,Mn)As and (Ga,Mn)(As,P)
    Physical Review B 83 (2011) 235324(1)-235324(7).
  6. Z. Šourek, M. Kopecký, J. Fábry, J. Kub, A. Lausi, E. Busetto
    Multi-energy anomalous diffuse scattering
    Acta Crystallographica Section A 65 (2009) s216-s216.
  7. J. Zemek, J. Houdková, P. Jiříček, A. Jablonski, V. Jurka, J. Kub
    Determination of electron inelastic mean free paths for poly[methyl(phenyl)silylene] films
    Polymer 50 (2009) 2445-2450.
  8. J. Fábry, M. Kopecký, J. Kub
    A simple method of shielding area detectors from unwanted Bragg diffraction.
    Journal of Applied Crystallography 39 (2006) 127-127.