1. J. Fait, J. Čermák, J. Stuchlík, B. Rezek
    Complex nano-patterning of structural, optical, electrical and electron emission properties of amorphous silicon thin films by scanning probe
    Applied Surface Science 428 (2018) 1159-1165.
  2. P. Klapetek, A. Fejfar, B. Rezek, J. Čermák
    Local Current Measurements, Chapter 10 in Quantitative Data Processing in Scanning Probe Microscopy, SPM Applications for Nanometrology (2nd ed.)
    Quantitative Data Processing in Scanning Probe Microscopy 2nd Edition SPM Applications for Nanometrology by Petr Klapetek
  3. J. Čermák, L. Mihai, D. Sporea, Y. Galagan, J. Fait, A. Artemenko, P. Hrmová, B. Rezek, M. Straticiuc, I. Burdecea
    Proton irradiation induced changes in glass and polyethylene terephthalate substrates for photovoltaic solar cells
    Solar Energy Materials and Solar Cells 186 (2018) 284-290.
  4. J. Raymakers, H. Krýsová, A. Artemenko, J. Čermák, S.S. Nickley, P. Verstappen, S. Gielen, A. Kromka, K. Haenen, L. Kavan, W. Maes, B. Rezek
    Functionalization of boron-doped diamond with a push-pull chromophore via Sonogashira and CuAAC chemistry
    RSC Advances 8 (2018) 33276-33290.
  5. A. Fejfar, B. Rezek, J. Čermák
    Local Current Measurements
    Chapter 10 in Quantitative Data Processing in Scanning Probe Microscopy (Second edition), editor. P. Klapetek, , Elsevier, 2018, ISBN 978-0-12-813347-7