• Surface structure analysis by low-energy electron diffraction (LEED I-V), X-ray photoelectron spectroscopy (XPS), photoelectron diffraction (PED), ultraviolet photoelectron spectroscopy (UPS)
  • Optical properties of solid surface analysis by reflection energy-loss spectroscopy (REELS
  • Characterization of nanocrystalline carbon phases
  • Characterization of polar, semi-polar and non-polar GaN surfaces
  • Characterization of buried heterointerface by hard X-ray photoelectron spectroscopy (HAXPES)
  • Determination of electron band alignment in heterostructures by photoelectron spectroscopy
  • Ab initio density functional theory (DFT) calculations and analysis of atomic and electronic band structures

ORCID: 0000-0003-0430-3706